NEW OBSERVATION OF CHARGE INJECTION IN MOS ANALOG SWITCHES

Title:	NEW OBSERVATION OF CHARGE INJECTION IN MOS ANALOG SWITCHES
Authors:	CHEN, MJ GU, YB WU, T HSU, PC LIU, TH 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
Keywords:	INTEGRATED CIRCUITS;SWITCHED CAPACITOR NETWORKS
Issue Date:	3-Feb-1994
Abstract:	Based on experimental analogue MOS switches, the Letter reports a new observation of the charge injection component due to channel charges in weak inversion. As identified by the mixed-mode circuit and device simulations, this new component can contribute comparably to the switch-induced error voltage on a switched capacitor.
URI:	http://dx.doi.org/10.1049/el:19940177 http://hdl.handle.net/11536/2618
ISSN:	0013-5194
DOI:	10.1049/el:19940177
Journal:	ELECTRONICS LETTERS
Volume:	30
Issue:	3
Begin Page:	213
End Page:	214
Appears in Collections:	Articles

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