Title: Thickness dependence of Co anisotropy in TbFe/Co exchange-coupled bilayers
Authors: Lin, CC
Lai, CH
Wei, DH
Hsu, YJ
Shieh, HPD
光電工程學系
Department of Photonics
Issue Date: 1-Jun-2004
Abstract: The orientation of element-specific moments was determined by using x-ray magnetic circular dichroism spectroscopy to explore exchange anisotropy of TbFe/Co bilayers. Perpendicular anisotropy of 15 Angstrom Co was induced by TbFe through exchange coupling, resulting in the out-of-plane Co moments. With increasing the thickness, Co moments were gradually tilted to the in-plane orientation because of increasing planar anisotropy. In the bilayer with thick Co, interfacial Fe moments were unidirectionally aligned in the plane, leading to in-plane exchange bias of Co. The coercivity and exchange bias field of Co in the bilayers exhibited a strong dependence on Co thickness. (C) 2004 American Institute of Physics.
URI: http://dx.doi.org/10.1063/1.1689911
http://hdl.handle.net/11536/26688
ISSN: 0021-8979
DOI: 10.1063/1.1689911
Journal: JOURNAL OF APPLIED PHYSICS
Volume: 95
Issue: 11
Begin Page: 6846
End Page: 6848
Appears in Collections:Conferences Paper


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