Title: | Thickness dependence of Co anisotropy in TbFe/Co exchange-coupled bilayers |
Authors: | Lin, CC Lai, CH Wei, DH Hsu, YJ Shieh, HPD 光電工程學系 Department of Photonics |
Issue Date: | 1-Jun-2004 |
Abstract: | The orientation of element-specific moments was determined by using x-ray magnetic circular dichroism spectroscopy to explore exchange anisotropy of TbFe/Co bilayers. Perpendicular anisotropy of 15 Angstrom Co was induced by TbFe through exchange coupling, resulting in the out-of-plane Co moments. With increasing the thickness, Co moments were gradually tilted to the in-plane orientation because of increasing planar anisotropy. In the bilayer with thick Co, interfacial Fe moments were unidirectionally aligned in the plane, leading to in-plane exchange bias of Co. The coercivity and exchange bias field of Co in the bilayers exhibited a strong dependence on Co thickness. (C) 2004 American Institute of Physics. |
URI: | http://dx.doi.org/10.1063/1.1689911 http://hdl.handle.net/11536/26688 |
ISSN: | 0021-8979 |
DOI: | 10.1063/1.1689911 |
Journal: | JOURNAL OF APPLIED PHYSICS |
Volume: | 95 |
Issue: | 11 |
Begin Page: | 6846 |
End Page: | 6848 |
Appears in Collections: | Conferences Paper |
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