Title: | Measurement of wavelength shift by using surface plasmon resonance heterodyne interferometry |
Authors: | Chen, KH Hsu, CC Su, DC 光電工程學系 Department of Photonics |
Issue Date: | 1-Aug-2002 |
Abstract: | A linearly polarized light is incident on a surface plasmon resonance (SPR) apparatus at the resonant angle. the surface plasmons are excited, Small wavelength shifts will introduce phase difference variations between s- and p-polarizations of the reflected light. These phase difference variations can be measured accurately by using heterodyne interferometry. Based on these facts, a novel method for measuring small wavelength shifts is proposed. It has the advantages of both common-path interferometry and heterodyne interferometry. (C) 2002 Elsevier Science B.V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/S0030-4018(02)01641-3 http://hdl.handle.net/11536/28618 |
ISSN: | 0030-4018 |
DOI: | 10.1016/S0030-4018(02)01641-3 |
Journal: | OPTICS COMMUNICATIONS |
Volume: | 209 |
Issue: | 1-3 |
Begin Page: | 167 |
End Page: | 172 |
Appears in Collections: | Articles |
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