DESIGN OF PSEUDOEXHAUSTIVE TESTABLE PLA WITH LOW OVERHEAD

Title:	DESIGN OF PSEUDOEXHAUSTIVE TESTABLE PLA WITH LOW OVERHEAD
Authors:	SHEN, WZ HWANG, GH HSU, WJ JAN, YJ 電控工程研究所 Institute of Electrical and Control Engineering
Keywords:	BUILT-IN SELF-TEST;DESIGN FOR TESTABILITY;PROGRAMMABLE LOGIC ARRAY;PSEUDOEXHAUSTIVE TESTING
Issue Date:	1-Jul-1993
Abstract:	The pseudoexhaustive testing (PET) scheme is a economic approach to test a large embedded programmable logic array (PIA). In this paper, we propose an efficient algorithm named low overhead PET (LOPET) to partition the product lines. By applying our algorithm, both the area overhead and test length are reduced significantly.
URI:	http://dx.doi.org/10.1109/12.237730 http://hdl.handle.net/11536/2948
ISSN:	0018-9340
DOI:	10.1109/12.237730
Journal:	IEEE TRANSACTIONS ON COMPUTERS
Volume:	42
Issue:	7
Begin Page:	887
End Page:	891
Appears in Collections:	Articles

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