Title: High resolution central fringe identification
Authors: Lee, JY
Su, DC
光電工程學系
Department of Photonics
Keywords: central fringe;heterodyne interferometry
Issue Date: 1-Nov-1998
Abstract: A high resolution central fringe identification by using the heterodyne interferometry with a tunable laser-diode and a fixed wavelength laser is presented. It can be operated easily and can be used to judge which arm of the Michelson interferometer is longer. The feasibility is demonstrated and it has 0.2 nm resolution. (C) 1998 Elsevier Science B.V. All rights reserved.
URI: http://hdl.handle.net/11536/31786
ISSN: 0030-4018
Journal: OPTICS COMMUNICATIONS
Volume: 156
Issue: 1-3
Begin Page: 1
End Page: 4
Appears in Collections:Articles


Files in This Item:

  1. 000076960300001.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.