ANALYSIS OF THE DX TRAPS INDUCED TRANSIENT CHARACTERISTICS IN ALGAAS GAAS HEMTS

doi:10.1016/0038-1101(90)90223-2

Title:	ANALYSIS OF THE DX TRAPS INDUCED TRANSIENT CHARACTERISTICS IN ALGAAS GAAS HEMTS
Authors:	WANG, TH YU, CC 交大名義發表電控工程研究所 National Chiao Tung University Institute of Electrical and Control Engineering
Issue Date:	1-Aug-1990
URI:	http://dx.doi.org/10.1016/0038-1101(90)90223-2 http://hdl.handle.net/11536/4057
ISSN:	0038-1101
DOI:	10.1016/0038-1101(90)90223-2
Journal:	SOLID-STATE ELECTRONICS
Volume:	33
Issue:	8
Begin Page:	1081
End Page:	1087
Appears in Collections:	Articles