IMPROVEMENT ON THE CURRENT-VOLTAGE CHARACTERISTICS OF POLYCRYSTALLINE SILICON CONTACTED N+-P JUNCTIONS WITH HIGH-FIELD STRESSING

doi:10.1063/1.102606

Title:	IMPROVEMENT ON THE CURRENT-VOLTAGE CHARACTERISTICS OF POLYCRYSTALLINE SILICON CONTACTED N+-P JUNCTIONS WITH HIGH-FIELD STRESSING
Authors:	WU, SL LEE, CL LEI, TF 交大名義發表電控工程研究所 National Chiao Tung University Institute of Electrical and Control Engineering
Issue Date:	12-Mar-1990
URI:	http://dx.doi.org/10.1063/1.102606 http://hdl.handle.net/11536/4156
ISSN:	0003-6951
DOI:	10.1063/1.102606
Journal:	APPLIED PHYSICS LETTERS
Volume:	56
Issue:	11
Begin Page:	1031
End Page:	1033
Appears in Collections:	Articles