| Title: | INTERFEROMETRIC MEASUREMENTS OF THE THICKNESS OF NEMATIC LIQUID-CRYSTAL FILMS WITH A FREE-SURFACE |
| Authors: | CHEN, SM PAN, RP PAN, CL 交大名義發表 電子物理學系 National Chiao Tung University Department of Electrophysics |
| Issue Date: | 1-Dec-1989 |
| URI: | http://hdl.handle.net/11536/4251 |
| ISSN: | 0740-3224 |
| Journal: | APPLIED OPTICS |
| Volume: | 28 |
| Issue: | 23 |
| Begin Page: | 4969 |
| End Page: | 4971 |
| Appears in Collections: | Articles |
- Intracavity measurement of liquid crystal layer thickness by wavelength tuning of an external cavity laser diode / Lan, YP;Lin, YF;Li, YT;Pan, RP;Lee, CK
- Three-dimensional coating flow of nematic liquid crystal on an inclined substrate / Lam, M. A.;Cummings, L. J.;Lin, T. -S.;Kondic, L.
- MAGNETIC-FIELD-INDUCED FREEDERICKSZ TRANSITION AND THE DYNAMIC-RESPONSE OF NEMATIC LIQUID-CRYSTAL FILMS WITH A FREE-SURFACE / CHEN, SM;HSIEH, TC;PAN, RP
- Ionic effects on electro-optics and residual direct current voltages of twisted nematic liquid crystal cells / Chen, Po-An;Yang, Kei-Hsiung
Loading...