| Title: | A NEW METHOD FOR DETERMINING THE TERMINAL SERIES RESISTANCES AND HIGH-INJECTION COEFFICIENT OF BIPOLAR-TRANSISTORS IN CMOS INTEGRATED-CIRCUITS FOR COMPUTER-AIDED CIRCUIT MODELING |
| Authors: | YANG, YH WU, CY CHEN, WY 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
| Issue Date: | 1-May-1988 |
| URI: | http://hdl.handle.net/11536/4537 |
| ISSN: | 0038-1101 |
| Journal: | SOLID-STATE ELECTRONICS |
| Volume: | 31 |
| Issue: | 5 |
| Begin Page: | 929 |
| End Page: | 936 |
| Appears in Collections: | Articles |
- AN ANALYSIS AND THE FABRICATION TECHNOLOGY OF THE LAMBDA BIPOLAR-TRANSISTOR / WU, CY
- Extraction of eleven model parameters for consistent reproduction of lateral bipolar snapback high-current I-V characteristics in NMOS devices / Chen, MJ;Lee, HS;Chen, ST
- EMPIRICAL MODELING FOR GATE-CONTROLLED COLLECTOR CURRENT OF LATERAL BIPOLAR-TRANSISTORS IN AN N-MOSFET STRUCTURE / HUANG, TH;CHEN, MJ
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