薄膜產業三階段品質管制流程之構建

Abstract

模內裝飾（In-Mold Decoration, IMD）技術是近年來廣為使用之一種產品表面裝飾技術，其中的模內轉印（In-Mold Roller, IMR）因製程具備自動化之優勢、成本低且模印精度高，非常適合用來製作電子產品的外殼。隨著各家3C大廠競爭越趨激烈，IMR技術中的關鍵原料IMR薄膜，供應亦變得十分吃緊，因此如何對IMR薄膜產線進行有效的品質監控是一項重要的議題。目前薄膜製造廠使用單張的xbar-S管制圖來監控薄膜厚度，但xbar-S管制圖是針對單一變異來源的系統所設計，而在薄膜製造過程中，品質變異的來源可能有許多種，因此以業界的現行管制方式， 管制圖容易出現嚴重失控情況的假警報現象。本研究的主要目的是針對薄膜產業之產線品質構建一套三階段管制流程，逐步管制薄膜製程中的多種變異來源，此外，本論文應用Shewhart－CUSUM管制圖來監控IMR薄膜各層的產線厚度，可對製程中不同程度的偏移進行有效的管制。本論文最後以國內某薄膜製造廠提供之產線厚度資料來說明如何應用本研究所提出之三階管制流程。

In-Mold Decoration (IMD) is one of the most popular technologies in surface decorating technology. Because In-Mold Roller (IMR) technology has the advantages of automatic process and low cost, it can be utilized to produce the shell of electronic products. In recent years, due to the competition of 3C manufacturers, the supply of thin film for IMR has become insufficient. Therefore, developing an effective quality control system for thin film is an important issue in thin film industry. Currently, many thin film factories uses xbar-S control chart to monitor the thickness of thin film, but xbar-S control chart is designed for detecting single source of variation in a manufacturing process. There are several sources of variation in the thin film manufacturing process, and using chart to detect variation of thin film will cause many false alarms. Thus, this study presents a control procedure to effectively identify three types of variation for the thin films. Moreover, the proposed procedure combines the Shewhart control chart and CUSUM control chart, thus, it can detect small and large shifts in the manufacturing process. Finally, a real case of a thin film factory is utilized to demonstrate the effectiveness of the proposed procedure.