Title: THE EFFECTS OF THERMAL SILICIDATION ON THE CURRENT TRANSPORT CHARACTERISTICS OF TI/(111)SI SCHOTTKY-BARRIER CONTACTS
Authors: TSENG, HH
WU, CY
交大名義發表
工學院
National Chiao Tung University
College of Engineering
Issue Date: 1-Jan-1988
URI: http://hdl.handle.net/11536/4578
ISSN: 0038-1101
Journal: SOLID-STATE ELECTRONICS
Volume: 31
Issue: 1
Begin Page: 35
End Page: 44
Appears in Collections:Articles