MOBILITY MODELS FOR THE IV CHARACTERISTICS OF BURIED-CHANNEL MOSFETS

Title:	MOBILITY MODELS FOR THE IV CHARACTERISTICS OF BURIED-CHANNEL MOSFETS
Authors:	WU, CY HSU, KC 交大名義發表電控工程研究所 National Chiao Tung University Institute of Electrical and Control Engineering
Issue Date:	1985
URI:	http://hdl.handle.net/11536/4804
ISSN:	0038-1101
Journal:	SOLID-STATE ELECTRONICS
Volume:	28
Issue:	9
Begin Page:	917
End Page:	923
Appears in Collections:	Articles