AN INVESTIGATION OF MINORITY-CARRIER LIFETIME IN SILICON DOPED EITHER WITH ZINC OR COBALT

Title:	AN INVESTIGATION OF MINORITY-CARRIER LIFETIME IN SILICON DOPED EITHER WITH ZINC OR COBALT
Authors:	CHANG, CY SU, YK CHI, CC 交大名義發表 National Chiao Tung University
Issue Date:	1980
URI:	http://hdl.handle.net/11536/5043
ISSN:	0020-7217
Journal:	INTERNATIONAL JOURNAL OF ELECTRONICS
Volume:	48
Issue:	1
Begin Page:	1
End Page:	6
Appears in Collections:	Articles