晶圓探測站之視覺自動導引探測系統

Title:	晶圓探測站之視覺自動導引探測系統 Vision-Based Automatic Probing System for Wafer Probe Station
Authors:	林錫寬 LIN SHIR-KUAN 交通大學電機與控制工程系
Issue Date:	2002
Gov't Doc #:	NSC91-2622-E009-021-CC3
URI:	http://hdl.handle.net/11536/93251 https://www.grb.gov.tw/search/planDetail?id=733298&docId=138539
Appears in Collections:	Research Plans