| Title: | 毫微米SOI技術 Very Deep Submicron SOI (Silicon-On-Insulator) Technology |
| Authors: | 施敏 國立交通大學電子工程研究所 |
| Issue Date: | 1995 |
| Gov't Doc #: | NSC84-2215-E009-082 |
| URI: | http://hdl.handle.net/11536/96336 https://www.grb.gov.tw/search/planDetail?id=150929&docId=24925 |
| Appears in Collections: | Research Plans |
- 深次微米SOI元件相關特性之研究 / 林憶霞;Lin, Yei-Shya;施敏;Sze Simon-Min
- Reduced reverse narrow channel effect in thin SOI nMOSFETs / Chang, CY;Chang, SJ;Chao, TS;Wu, SD;Huang, TY
- 互補式金氧半導體╱在絕緣體上矽晶元件模擬：聚集模式與加強模式之比較 / 鄭召寶;C.B.Cheng;孫喜眾,陳茂傑;S.C.Sun,M.C.Chen
- 次微米MOS SOI元件之分析與設計 / 鄭躍晴;Yao-Chin Cheng;莊紹勳;Steve Shao-Shiun Chung
- 半空乏型矽氧化絕緣基片MOS元件之熱電子可靠性 / 葉俊祺;Yeh, Jun-Chyi;莊紹勳;Steve S. Chung
- Hot-carrier-induced degradation for partially depleted SOI 0.25-0.1 mu m CMOSFET with 2-nm thin gate oxide / Yeh, WK;Wang, WH;Fang, YK;Chen, MC;Yang, FL
- 耐放射線/輻射線之半導體基板SOI之研製 / 張寶心;Bao-Shin Chang;葉清發;Ching-Fa Yeh
- 一種製造於部分空乏型矽在絕緣層上之短通道金氧半場效電晶體的二維解析模式 / 許勝福;HSU,SHENG-FU;吳慶源;Ching-Yuan wu
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