Browsing by Author Kuo, SN
Showing results 1 to 3 of 3
| Issue Date | Title | Author(s) |
| 1997 | Performance and reliability evaluations of P-channel flash memories with different programming schemes | Chung, SS; Kuo, SN; Yih, CM; Chao, TS; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-Nov-1997 | A unified approach to profiling the lateral distributions of both oxide charge and interface states in n-MOSFET's under various bias stress conditions | Cheng, SM; Yih, CM; Yeh, JC; Kuo, SN; Chung, SS; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-Nov-1997 | A unified approach to profiling the lateral distributions of both oxide charge and interface states in n-MOSFET's under various bias stress conditions | Cheng, SM; Yih, CM; Yeh, JC; Kuo, SN; Chung, SS; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
