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dc.contributor.authorLin, Y. C.en_US
dc.contributor.authorChiu, C. H.en_US
dc.contributor.authorFan, W. C.en_US
dc.contributor.authorChia, C. H.en_US
dc.contributor.authorYang, S. L.en_US
dc.contributor.authorChuu, D. S.en_US
dc.contributor.authorLee, M. C.en_US
dc.contributor.authorChen, W. K.en_US
dc.contributor.authorChang, W. H.en_US
dc.contributor.authorChou, W. C.en_US
dc.date.accessioned2014-12-08T15:12:58Z-
dc.date.available2014-12-08T15:12:58Z-
dc.date.issued2007-12-15en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.2826936en_US
dc.identifier.urihttp://hdl.handle.net/11536/10005-
dc.description.abstractThe vibrational, electronic, and crystalline properties of n-type chlorine-doped ZnSe (ZnSe:Cl) layers with a carrier concentration from 8.2x10(15) to 1.8x10(18) cm(-3) are studied by Raman spectroscopy. The spectral line shapes of the longitudinal-optical-phonon and plasmon coupling mode are analyzed using the Raman scattering efficiency and the dielectric function to obtain the electron densities and mobility. The splitting of the transverse-optical (TO) phonon and the redshift of the chlorine-related impurity vibration mode are clearly observed when pressure is applied. The semiconductor-to-metal phase transition pressure of ZnSe:Cl layers declines as the carrier concentration increases, indicating that n-type doping reduces crystal stability. Additionally, the pressure-induced weakening of the longitudinal-optical-phonon-plasmon coupling efficiency suggests that pressure tends to degrade the n-type characteristic of ZnSe:Cl because of the emergence of the new deep donorlike state. (c) 2007 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titleRaman scattering of longitudinal-optical-phonon-plasmon coupling in Cl-doped ZnSe under high pressureen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.2826936en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume102en_US
dc.citation.issue12en_US
dc.citation.epageen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000251987600031-
dc.citation.woscount3-
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