標題: | Approximately Unbiased Estimator for Non-Normal Process Capability Index C-Npk |
作者: | Pearn, W. L. Tai, Y. T. Hsiao, I. F. Ao, Y. P. 工業工程與管理學系 Department of Industrial Engineering and Management |
關鍵字: | non-normal process;lower confidence bound;bootstrap |
公開日期: | 1-十一月-2014 |
摘要: | Process capability indices (PCIs) have been extensively used to evaluate and measure whether the process meets the specifications and they provide quality assurance and guide a principal for quality improvement. The index C-pk is the most popular index and is widely used in the manufacturing industry for manufacturing yield evaluation. However, typical evaluations of C-pk depend heavily on the assumption of normal variability. When the underlying distributions are non-normal, the capability evaluations are highly unreliable. In the paper, we apply four various bootstrap methods to construct lower confidence bounds of C-Npk for non-normal processes. We also propose an approximately unbiased estimator of C-Npk for the non-normal processes. Comparisons among the four bootstrap methods with different estimators are provided. |
URI: | http://dx.doi.org/10.1520/JTE20130125 http://hdl.handle.net/11536/124282 |
ISSN: | 0090-3973 |
DOI: | 10.1520/JTE20130125 |
期刊: | JOURNAL OF TESTING AND EVALUATION |
Volume: | 42 |
顯示於類別: | 期刊論文 |