Full metadata record
DC FieldValueLanguage
dc.contributor.authorChen, Kun-Huangen_US
dc.contributor.authorChen, Jing-Hengen_US
dc.contributor.authorLin, Jiun-Youen_US
dc.contributor.authorSu, Der-Chinen_US
dc.contributor.authorSu, Jung-Chiehen_US
dc.date.accessioned2017-04-21T06:48:51Z-
dc.date.available2017-04-21T06:48:51Z-
dc.date.issued2008en_US
dc.identifier.issn1862-6351en_US
dc.identifier.urihttp://dx.doi.org/10.1002/pssc.200777738en_US
dc.identifier.urihttp://hdl.handle.net/11536/135092-
dc.description.abstractA phase-sensitive method is developed to simultaneously measure the cell parameters of a TNLC (twisted-nematic liquid crystal) cell based on Jones calculus and the heterodyne interferometric ellisometry. These cell parameters include the twist angle, the cell gap, and the angle of the entrance LC director. When a circularly polarized heterodyne light beam normally passes through a TNLC cell, the phase difference between the p- and s- polarization of the interference signal can be measured accurately with an analyzer and the heterodyne interferometric ellisometry. The phase difference depends on the azimuth angle of the analyzer and the parameters. By substituting the measured values of the phase differences at three different azimuth angles of the analyzer into the special equations derived with Jones calculus. Hence these three para meters can be esitimated by using a personal computer with numerical analysis technique. Because of its common path optical configuration and its heterodyne interferometric ellisometry, this method has many merits such as high stability against the surrounding vibration, high resolution, and easy operation.en_US
dc.language.isoen_USen_US
dc.titleAn alternative method for simultaneously measuring cell parameters of a twisted-nematic liquid crystal cellen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1002/pssc.200777738en_US
dc.identifier.journalPHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 5, NO 5en_US
dc.citation.volume5en_US
dc.citation.issue5en_US
dc.citation.spage1023en_US
dc.citation.epage+en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000256862500006en_US
dc.citation.woscount1en_US
Appears in Collections:Conferences Paper