標題: | Diagnosability of t-connected networks and product networks under the comparison diagnosis model |
作者: | Chang, CP Lai, PL Tan, JJM Hsu, LH 資訊工程學系 Department of Computer Science |
關鍵字: | diagnosability;comparison diagnosis model;t-diagnosable;connectivity;order graph;product networks |
公開日期: | 1-十二月-2004 |
摘要: | Diagnosability is an important factor in measuring the reliability of an interconnection network, while the (node) connectivity is used to measure the fault tolerance of an interconnection network. We observe that there is a close relationship between the connectivity and the diagnosability. According to our results, a t-regular and t-connected network with at least 2t + 3 nodes is t-diagnosable. Furthermore, the diagnosability of the product networks is also investigated in this work. The product networks, including hypercube, mesh, and tori, comprise very important classes of interconnection networks. Herein, different combinations of t-diagnosable and t-connected are employed to study the diagnosability of the product networks. |
URI: | http://dx.doi.org/10.1109/TC.2004.114 http://hdl.handle.net/11536/148813 |
ISSN: | 0018-9340 |
DOI: | 10.1109/TC.2004.114 |
期刊: | IEEE TRANSACTIONS ON COMPUTERS |
Volume: | 53 |
起始頁: | 1582 |
結束頁: | 1590 |
顯示於類別: | 期刊論文 |