Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chiu, Shao-Chien | en_US |
dc.contributor.author | Jhang, Jia-Sin | en_US |
dc.contributor.author | Lin, Yen-Fu | en_US |
dc.contributor.author | Hsu, Shih-Ying | en_US |
dc.contributor.author | Fang, Jiye | en_US |
dc.contributor.author | Jian, Wen-Bin | en_US |
dc.date.accessioned | 2014-12-08T15:32:08Z | - |
dc.date.available | 2014-12-08T15:32:08Z | - |
dc.date.issued | 2013 | en_US |
dc.identifier.issn | 2040-3364 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/22624 | - |
dc.identifier.uri | http://dx.doi.org/10.1039/c3nr01418e | en_US |
dc.description.abstract | Bulk nanostructured materials are made from the assembly of octahedral PbSe nanocrystals. After thermal annealing, the artificial bulk demonstrates a large difference in behavior depending on the temperature, and a large variation of room-temperature resistivity of up to seven orders of magnitude. This variation originates from the high-indexed sharp edges of the octahedral nanocrystals. As the nanocrystals are arranged in the edge-to-edge configuration, which was observed in scanning electron microscopy images, the inter-nanocrystal capacitance is small due to the small parallel area between the nanocrystals. The small capacitance results in a high thermal fluctuation voltage and drives electron transport. The temperature-dependent resistivity and the electric field-dependent current are highly in agreement with the model of fluctuation-induced tunneling conduction. Thermal annealing reduces the inter-nanocrystal separation distance, creating a large variation in the electrical properties. Specifically, octahedral-shaped PbSe nanocrystals are employed in tailoring the electron transport in bulk nanostructured materials. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Nanocrystal shape and nanojunction effects on electron transport in nanocrystal-assembled bulks | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1039/c3nr01418e | en_US |
dc.identifier.journal | NANOSCALE | en_US |
dc.citation.volume | 5 | en_US |
dc.citation.issue | 18 | en_US |
dc.citation.spage | 8555 | en_US |
dc.citation.epage | 8559 | en_US |
dc.contributor.department | 電子物理學系 | zh_TW |
dc.contributor.department | Department of Electrophysics | en_US |
dc.identifier.wosnumber | WOS:000323521000033 | - |
dc.citation.woscount | 0 | - |
Appears in Collections: | Articles |
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