Title: | The potential of functional scaling |
Authors: | Chin, A McAlister, SP 奈米科技中心 Center for Nanoscience and Technology |
Issue Date: | 1-Jan-2005 |
URI: | http://dx.doi.org/10.1109/MCD.2005.1388766 http://hdl.handle.net/11536/25366 |
ISSN: | 8755-3996 |
DOI: | 10.1109/MCD.2005.1388766 |
Journal: | IEEE CIRCUITS & DEVICES |
Volume: | 21 |
Issue: | 1 |
Begin Page: | 27 |
End Page: | 35 |
Appears in Collections: | Articles |
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