Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Ling, H. S. | en_US |
dc.contributor.author | Wang, S. Y. | en_US |
dc.contributor.author | Lee, C. P. | en_US |
dc.date.accessioned | 2014-12-08T15:47:18Z | - |
dc.date.available | 2014-12-08T15:47:18Z | - |
dc.date.issued | 2011-05-01 | en_US |
dc.identifier.issn | 1350-4495 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1016/j.infrared.2010.12.020 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/31731 | - |
dc.description.abstract | Long-wavelength InAs QDIPs with different thicknesses of InGaAs cap layer in the confinement-enhanced dots-in-a-well (CE-DWELL) structure were investigated. The sample with 3 nm cap layer shows primarily single band detection at 7 mu m that stems from the transition between QD states, but the 5 nm and 7 nm samples reveal voltage-tunable dual band detection in the region of 6-11 mu m from transitions to the states in the dots as well as the states in the well. The wavefunction coupling of transition states is effectively modified by the change of cap-layer thickness and the bias polarity, which leads to the observed spectral change and demonstrates the flexibility of the CE-DWELL QDIPs. For higher peak quantum efficiency (QE), thin InGaAs cap layers are used to obtain focused absorption strength. With 3 nm cap layer in the CE-DWELL, a respectable QE of 7.23% is reached for 10-stack QDIPs with 7 mu m detection wavelength at 77K. and a high detectivity of 3.4 x 10(10) Jones is also obtained. (C) 2010 Elsevier B.V. All rights reserved. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Quantum dot | en_US |
dc.subject | Intersubband | en_US |
dc.subject | Infrared detector | en_US |
dc.title | Spectral response and device performance tuning of long-wavelength InAs QDIPs | en_US |
dc.type | Article; Proceedings Paper | en_US |
dc.identifier.doi | 10.1016/j.infrared.2010.12.020 | en_US |
dc.identifier.journal | INFRARED PHYSICS & TECHNOLOGY | en_US |
dc.citation.volume | 54 | en_US |
dc.citation.issue | 3 | en_US |
dc.citation.spage | 233 | en_US |
dc.citation.epage | 236 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000290973200017 | - |
Appears in Collections: | Conferences Paper |
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