| 標題: | 雙波長雷射二極體干涉儀的部份條紋技術之研究 Two-Wavelength Laser-Diode Interferometer with Fractional Fringe Techniques |
| 作者: | 蘇德欽 SU DER-CHIN 交通大學光電工程研究所 |
| 關鍵字: | 雙波長;部份條紋技術;等效波長;調變器;雷射二極體;Two wavelength;Fractional fringe technique;Equivalent wavelength;Modulator;Laser diode |
| 公開日期: | 1997 |
| 官方說明文件#: | NSC86-2215-E009-013 |
| URI: | http://hdl.handle.net/11536/95363 https://www.grb.gov.tw/search/planDetail?id=283424&docId=51271 |
| 顯示於類別： | 研究計畫 |
- Step Height Measurement by Using Heterodyne Central Fringe Identification Technique / Wu, W. T.;Hsieh, H. C.;Chen, Y. L.;Chang, W. Y.;Su, D. C.
- Central fringe identification using a heterodyne interferometric technique and a tunable laser-diode / Lee, JY;Chiu, MH;Su, DC
- 2-WAVELENGTH INTERFEROMETER BASES ON A 2-COLOR LASER-DIODE ARRAY AND THE 2ND-ORDER CORRELATION TECHNIQUE / WANG, CL;CHUANG, YH;PAN, CL
- High resolution central fringe identification / Lee, JY;Su, DC
- 2-WAVELENGTH LASER INTERFEROMETER BASED ON THE FREQUENCY-DIVISION-MODULATED LASER DIODE SOURCES / CHIEN, PY
- Method for gauge block measurement with the heterodyne central fringe identification technique / Wu, Wang-Tsung;Chen, Yen-Liang;Hsieh, Hung-Chih;Chang, Wei-Yao;Su, Der-Chin
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