Browsing by Author "Chang, Chun-Wei (Jacky)"

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SERL: Soft Error Resilient Latch Design
(2016)
Chang, Chun-Wei (Jacky)
;
Huang, Hsuan-Ming (Ryan)
;
Lin, Yuwen
;
Wen, Charles H. -P.
;
電機工程學系
Soft errors, radiation-induced transient faults latched by memory elements, have emerged to be one dominant failure mechanism for scaled CMOS designs. Therefore, this paper presents a robust design named soft error resilient latch (SERL). Compared to BISER, one of the latest latch designs, SERL demonstrates better soft error protection with smaller area overhead.