Browsing by Author "Chang, P. -H."
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Item type:Item, Anisotropic Structure Induced Electrical Properties of A-plane InN(2013-01-01) ;Chang, P. -H. ;Chia, J. -W. ;Gwo, S. ;Ahn, H.物理研究所Terahertz spectroscopy reveals that the anisotropic electrical properties of nonpolar InN film along in-plane c-axis and in-plane m-axis are determined by the orientation of narrow and thin stacking faults, not by the density of defects.