Browsing by Author "Chang Ming-Hung"

Now showing 1 - 9 of 9

Charge pump
(2012-02-28)
Wu Chun-Yi
;
Hsieh Wei-Chih
;
Chang Ming-Hung
;
Hwang Wei
A charge pump is disclosed for amplifying an input voltage received at an input end and outputting the amplified voltage at an output end as an output voltage. The charge pump includes a plurality of source/drain coupling transistors for serving as charging capacitors, and a plurality of cascode-connected transistors being symmetrically connected to between the input end and the output end. The charge pump further includes a plurality of diode-connected transistors to protect the source/drain coupling transistors against breakdown during the course of charge transfer and to speed up the charge transfer.
DUAL-PORT SUBTHRESHOLD SRAM CELL
(2012-12-06)
Chiu Yi-Te
;
Chang Ming-Hung
;
Yang Hao-I
;
Hwang Wei
An innovative dual-port subthreshold static random access memory (SRAM) cell for sub-threshold voltage operation is disclosed. During write mode, the dual-port subthreshold SRAM cell would cut off the positive feedback loop of the inverters and utilize the reverse short-channel effect to enhance write capability. The single-ended read/write port structure further reduces power consumption of the lengthy bit line. Therefore, the dual-port subthreshold SRAM cell is a suitable for long operation in a first-in first-out memory system. Although the lower voltage reduces the stability of the memory cell, the dual-port subthreshold SRAM cell of the present invention can still stably operate.
Dual-port subthreshold SRAM cell
(2013-07-30)
Chiu Yi-Te
;
Chang Ming-Hung
;
Yang Hao-I
;
Hwang Wei
An innovative dual-port subthreshold static random access memory (SRAM) cell for sub-threshold voltage operation is disclosed. During write mode, the dual-port subthreshold SRAM cell would cut off the positive feedback loop of the inverters and utilize the reverse short-channel effect to enhance write capability. The single-ended read/write port structure further reduces power consumption of the lengthy bit line. Therefore, the dual-port subthreshold SRAM cell is a suitable for long operation in a first-in first-out memory system. Although the lower voltage reduces the stability of the memory cell, the dual-port subthreshold SRAM cell of the present invention can still stably operate.
Fully-on-chip temperature, process, and voltage sensor system
(2013-04-16)
Chen Shi-Wen
;
Chang Ming-Hung
;
Hsieh Wei-Chih
;
Hwang Wei
A fully on-chip temperature, process, and voltage sensor includes a voltage sensor, a process sensor and a temperature sensor. The temperature sensor includes a bias current generator, a ring oscillator, a fixed pulse generator, an AND gate, and a first counter. The bias current generator generates an output current related to temperature according to the operating voltage of chip. The ring oscillator generates an oscillation signal according to the output current. The fixed pulse generator generates a fixed pulse signal. The AND gate is connected to the ring oscillator and the fixed pulse generator for performing a logic AND operation on the oscillation signal and the fixed pulse signal, and generating a temperature sensor signal.
Method for buffering clock skew by using a logical effort
(2013-07-16)
Hsieh Chung-Ying
;
Chang Ming-Hung
;
Hwang Wei
A method buffers clock skew by using a logical effort, and is applicable to a clock tree that stays in a strong-inversion region, a moderate-inversion region, or a weak-inversion region. The method includes establishing in the clock tree a temperature sensor and a tunable-width buffer, and establishing width and temperature comparative lists according to a logical effort equation, for the tunable-width buffer to be individually applied to the strong-inversion region, the moderate-inversion region, and the weak-inversion region; selecting one from the width and temperature comparative lists that corresponds to one of the inversion regions in which the clock tree stays, enabling the temperature sensor to sense a temperature, and searching the selected width and temperature comparative list for a width that corresponds to the temperature sensed by the temperature sensor; and enabling the tunable-width buffer to perform a width modulation process according to the searched width.
METHOD FOR BUFFERING CLOCK SKEW BY USING A LOGICAL EFFORT
(2012-07-05)
Hsieh Chung-Ying
;
Chang Ming-Hung
;
Hwang Wei
A method buffers clock skew by using a logical effort, and is applicable to a clock tree that stays in a strong-inversion region, a moderate-inversion region, or a weak-inversion region. The method includes establishing in the clock tree a temperature sensor and a tunable-width buffer, and establishing width and temperature comparative lists according to a logical effort equation, for the tunable-width buffer to be individually applied to the strong-inversion region, the moderate-inversion region, and the weak-inversion region; selecting one from the width and temperature comparative lists that corresponds to one of the inversion regions in which the clock tree stays, enabling the temperature sensor to sense a temperature, and searching the selected width and temperature comparative list for a width that corresponds to the temperature sensed by the temperature sensor; and enabling the tunable-width buffer to perform a width modulation process according to the searched width.
Programmable clock generator used in dynamic-voltage-and-frequency-scaling (DVFS) operated in sub- and near- threshold region
(2012-08-07)
Hsieh Chung-Ying
;
Chang Ming-Hung
;
Hwang Wei
A programmable clock generator, which is used in dynamic-voltage-and-frequency-scaling (DVFS) operated in Sub- and Near-Threshold region. The programmable clock generator includes first pulse generating unit and a pulse multiplier. A first counter is configured to generate a first counting signal, so as to control the phase detector comparing the phase difference between a first pulse signal and a second pulse signal. A first control signal is transmitted by a control unit in accordance with a phase difference signal, and the phase of the second pulse signal is adjusted by a lock-in delay unit, so that a predetermined phase is generated between the first pulse signal and the second pulse signal. The PVT variation may be compensated by the programmable clock generator during the sub threshold region. Therefore, the period of reference clock is in the locking range of lock-in delay line.
STATIC RANDOM ACCESS MEMORY CELL AND METHOD OF OPERATING THE SAME
(2012-09-13)
Chiu Yi-Te
;
Chang Ming-Hung
;
Yang Hao-I
;
Hwang Wei
A static random access memory cell includes a latch unit. The latch unit includes a bi-inverting circuit and a switching circuit. The bi-inverting circuit has a first terminal and a second terminal. The switching circuit is electrically connected between the first terminal and the second terminal, wherein when the switching circuit is turned on, the switching circuit forms a feedback between the first terminal and the second terminal for latching the latch unit; and when the switching circuit is turned off, the feedback is removed to cause the SRAM cell to write a data bit to the latch unit.
Static random access memory cell and method of operating the same
(2013-05-07)
Chiu Yi-Te
;
Chang Ming-Hung
;
Yang Hao-I
;
Hwang Wei
A static random access memory cell includes a latch unit. The latch unit includes a bi-inverting circuit and a switching circuit. The bi-inverting circuit has a first terminal and a second terminal. The switching circuit is electrically connected between the first terminal and the second terminal, wherein when the switching circuit is turned on, the switching circuit forms a feedback between the first terminal and the second terminal for latching the latch unit; and when the switching circuit is turned off, the feedback is removed to cause the SRAM cell to write a data bit to the latch unit.