Browsing by Author "Chen, Cheng-Li"

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Carbon-Coated Porous Aluminum Oxides Used as Spacer Overlayers to Reduce Secondary Electron Emission for Field Emission Display Applications
(2013-07-01)
Yu, Tung-Yuan
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Pan, Fu-Ming
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Chen, Cheng-Li
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Chen, Te-Ming
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Chen, Tsung-Han
Porous surface structures can mitigate the charging effect of vacuum spacers of field-emission flat panel display due to the abundance of secondary electrons (SEs) emitted from the spacers during field emission display (FED) operation. In this study, we fabricated porous anodic aluminum oxide (AAO) overlayers on glass substrates to examine the effect of carbon deposition on the reduction of SE emissions. This paper reports that uniform AAO overlayers can be simultaneously prepared on both sides of a glass plate 2 x 10 cm(2) in size. The SE emission of the AAO overlayer was examined by using an Auger electron microscope. When a small amount of carbon is evaporation-deposited on the as-prepared AAO overlayer, the SE emission efficiency is significantly decreased and the reduction in the SE emission is ascribed to the low SE yield of the carbon deposit and the suppression of SE escape from the narrowed pore channels. However, a heavy deposition of carbon results in a smaller surface roughness of the AAO overlayer, thereby increasing SE emission. The carbon-coated AAO overlayer demonstrates favorable electrical and mechanical properties, making it suitable for use in FED vacuum spacers. (C) 2013 The Japan Society of Applied Physics
Discriminating efficient candidates of MEA model
(2011-01-01)
Liu, Fuh-hwa Franklin
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Chen, Cheng-Li
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工業工程與管理學系
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Department of Industrial Engineering and Management
Multi-directional efficiency analysis (MBA) has the advantage of separating the issue of benchmark selection from the issue of efficiency measurement. Like most of DEA models, MBA model often identifies plural candidates to be efficient. Due to absence of weights and infeasibility, we are unable to create cross-efficiency and super-efficiency models of MEA for discriminating efficient candidates. The recent paper suggests a proper technique and proposes a worst-practice MBA model for discriminating efficient candidates. An empirical example is used for illustrative purposes.
The worst-practice DEA model with slack-based measurement
(2009-09-01)
Liu, Fuh-hwa Franklin
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Chen, Cheng-Li
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工業工程與管理學系
;
Department of Industrial Engineering and Management
An original data envelopment analysis (DEA) model is to evaluate each decision-making unit (DMU) with a set of most favorable weights of performance indices. The efficient DMUs obtained from the original DEA construct an efficient (best-practice) frontier. The original DEA can be considered to identify good (efficient) performers in the most favorable scenario. For the purpose of identifying bad performers such as bankrupt firms in the most unfavorable (worst-case) scenario., radial worst-practice frontier DEA (WPF-DEA) model in which the "worst efficient" DMUs construct a worst-practice frontier has been proposed. To identify bad performers together with the slack values we formulate another model called WPF-SBM. Then we develop the HypoSBM model to distinguish the worst performers from the bad ones. Finally, a solution approach is suggested to fully rank worst efficiencies in the worst-case scenario. (C) 2009 Published by Elsevier Ltd.