Browsing by Author "Chen, Chiu-Ling"

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Failure and degradation mechanisms of high-power white light emitting diodes
(2010-07-01)
Yang, Shih-Chun
;
Lin, Pang
;
Wang, Chien-Ping
;
Huang, Sheng Bang
;
Chen, Chiu-Ling
The investigation explores the factors that influence the long-term performance of high-power 1 W white light emitting diodes (LEDs). LEDs underwent an aging test in which they were exposed to various temperatures and electrical currents, to identify both their degradation mechanisms and the limitations of the LED chip and package materials. The degradation rates of luminous flux increased with electrical and thermal stresses. High electric stress induced surface and bulk defects in the LED chip during short-term aging, which rapidly increased the leakage current. Yellowing and cracking of the encapsulating lens were also important in package degradation at 0.7 A/85 degrees C and 0.7 A/55 degrees C. This degradation reduced the light extraction efficiency to an extent that is strongly related to junction temperature and the period of aging. junction temperatures were measured at various stresses to determine the thermal contribution and the degradation mechanisms. The results provided a complete understanding of the degradation mechanisms of both chip and package, which is useful in designing highly reliable and long-lifetime LEDs. Crown Copyright (C) 2010 Published by Elsevier Ltd. All rights reserved.
Spectral Analysis of Noise Sources in InGaN Light Emitting Diodes
(2011)
Lin, Gray
;
Su, Kuan-Lin
;
Yang, Shih-Tsun
;
Chen, Tzung-Te
;
Chen, Chiu-Ling
Noise characterization of InGaN light emitting diodes shows that the exponent in current dependence of low-frequency flicker noise amplitude and the corner frequency in high-frequency generation-recombination noise spectra are two possible indicators for device reliability. (C) 2010 Optical Society of America