Browsing by Author "Chen, JP"

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Bootstrap confidence interval of the difference between two process capability indices
(2003)
Chen, JP
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Tong, LI
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工業工程與管理學系
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Department of Industrial Engineering and Management
The process capability index, C-pk, is extensively used to assess process performance in manufacturing industry. Statistical hypothesis testing or an interval estimation of a single C-pk had been derived under a normally distributed process. However, the difference between two process capabilily indices, C-pk1 - C-pk2, cannot be inferred statistically because of the complexily of the sampling probability theory. This study proposes a bootstrap resampling simulation method to construct the biased corrected percentile bootstrap (BCPB) confidence interval Of (C-pk1 - C-pk2), which can be used to select the better of two suppliers. The various simulation results indicate that the bootstrap confidence interval Of (C-pk1 - C-pk2) can be employed to evaluate effectively the difference between the performance of two suppliers.
Testing process performance based on the yield: an application to the liquid-crystal display module
(2002-08-01)
Chen, JP
;
Pearn, WL
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工業工程與管理學系
;
Department of Industrial Engineering and Management
Process capability indices have been introduced to provide numerical measures on whether a manufacturing process is capable of reproducing items meeting the specifications predetermined by the product designers or the consumers. Process yield is one of the most common criteria used in the manufacturing industry for measuring process performance. The formula S-pk has been proposed to calculate the process yield for normal processes. The formula Spk provides an exact measure on the process yield. Unfortunately, the statistical properties of the estimated (S) over cap (pk) are mathematically intractable. In this paper, we apply the bootstrap simulation method to construct the lower confidence bound of S-pk. We then present a real-world application to the liquid-crystal display module process, to illustrate how we may apply the formula Spk to actual data collected from the factories. (C) 2002 Elsevier Science Ltd. All rights reserved.
Using hypermedia in computer-aided instruction
(1996-05-01)
Chen, LS
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Liu, PW
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Chang, KY
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Chen, JP
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Chen, SC