Browsing by Author "Chen, Shih-Fan"

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Fabrication of pure aluminum nanowires by using injection molding process in ambient air
(2015-06-01)
Chen, Shih-Hsun
;
Wang, Chiu-Yen
;
Chen, Yung-Chang
;
Hun, Chien-Wan
;
Chen, Shih-Fan
A simple method to prepare aluminum nanowires was achieved by using the injection molding process in the air. The Al nanowires were made with the average diameter of 60 nm and length of several micrometers. The difference between mold dimension and nanowires was caused by removing the outer oxide shell of Al nanowires. XRD, EDS and SAED results showed that the Al crystalline nanowires were fabricated exactly. The proposed concept successfully established a simple and low-cost method to have high-temperature and soft nano-materials under the non-vacuum surroundings. (C) 2015 Elsevier B.V. All rights reserved.
On-chip detection circuit for protection design in display panel against electrical fast transient (EFT) disturbance
(2011)
Yen, Cheng-Cheng
;
Ker, Ming-Dou
;
Lin, Wan-Yen
;
Yang, Che-Ming
;
Chen, Shih-Fan
A new on-chip detection circuit is proposed for electrical fast transient (EFT) protection design in a display system. For microelectronic products, electrical transient disturbances often cause upset or frozen states under the IEC test standard. The output signal of the proposed detection circuit can be used as a firmware index to execute system automatic recovery operations and to release the EFT-induced locked states in display panels. The circuit function to detect positive or negative electrical transients has been investigated in HSPICE simulation and verified in silicon chip. The experimental results have confirmed successful circuit performance under EFT tests. With hardware/firmware co-design, the immunity of a display system against electrical transient disturbance has been significantly improved.
Protection Design Against System-Level ESD Transient Disturbance on Display Panels
(2010-01-01)
Ker, Ming-Dou
;
Lin, Wan-Yen
;
Yen, Cheng-Cheng
;
Yang, Che-Ming
;
Chen, Tung-Yang
A hardware/firmware system co-design has been proposed in this work to protect display electronic products against system-level electrostatic discharge (ESD) transient disturbance. By including transient detection circuit, the firmware can execute system recovery procedure to recover all electrical functions under system-level ESD tests. The transient detection circuit is designed to detect different positive and negative fast electrical transients and verified in a 0.13 mu m CMOS process. The experimental results have confirmed that the proposed hardware/firmware design can successfully improve the susceptibility of display products against system level ESD zapping.