Browsing by Author "Cheon, Hwan-Sung"
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Item type:Item, Use of Spin-On-Hard Mask Materials for nano scale patterning technology(2008) ;Wu, Wen-Hao ;Chang, Edward Y. ;Cheon, Hwan-Sung ;Kim, Sang KyunCho, Hyeon MoAmorphous Carbon Layer (ACL) and SiON system has been proven to be a good hardmask combination. These layers are formed by a high cost, low throughput CVD process. This paper discloses a reliable, low cost, high throughput process using a simple spin on layer structure. Through manipulation of various parameters, additional BARC layer is eliminated and the process is further simplified to a tri-layer structure. Also, PR/SiON/C-SOH (Carbon-Spin-On-Hardmask) system has been compared to PR / Si-SOH (Si-Spin-On-Hardmask) / C-SOH system and found their performances are comparable. This indicates the PR / Si-SOH / C-SOH process is an economical yet comparable substitute.