Browsing by Author "Chou, WC"
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Item type:Item, A Raman study of ZnSe at high pressure(1997-06-01) ;Chou, WC ;Lin, CM ;Ro, RS ;Ho, CSHong, DYThe ZnSe was studied by Raman scattering spectroscopy at pressures up to 36 GPa at first time. The present researchers have found splittings of transverse optical (TO) phonon at 4.65 and 7.61 GPa. In addition, the Raman signals of the longitudinal optical (LO) phonon disappeared at 14.35 GPa. The disappearance of the LO phonon is attributed to the semiconductor-metal phase transition. However, the TO phonon peaks were still visible above the metallization pressure.Item type:Item, A Raman study of ZnSe at high pressure(1997-06-01) ;Chou, WC ;Lin, CM ;Ro, RS ;Ho, CSHong, DYThe ZnSe was studied by Raman scattering spectroscopy at pressures up to 36 GPa at first time. The present researchers have found splittings of transverse optical (TO) phonon at 4.65 and 7.61 GPa. In addition, the Raman signals of the longitudinal optical (LO) phonon disappeared at 14.35 GPa. The disappearance of the LO phonon is attributed to the semiconductor-metal phase transition. However, the TO phonon peaks were still visible above the metallization pressure.Item type:Item, Analysis of size distributions of type IIZnTe/ZnSe quantum dots(2004-12-01) ;Lee, J ;Yang, CS ;Chang, CT ;Liu, JRChou, WCThe photoluminescence (PL) spectrum of the ZnTe/ZnSe quantum dot (QD) structure which has a type II band alignment. was investigated. A broader structure peaking at 2.180 eV together with the features of the ZnSe buffer layer located at 2.820 eV in the PL spectrum at 10 K were observed. The broadness of the PL attributes to the spatial inhomogeneity of the QD sizes. The PL spectrum was a normal distribution with a variance of 0.002 eV(2). However, the dot size distribution was a deformed Gaussian. Using only one set of data of dot size distribution measured by the Atomic Force Microscopy (AFM), the statistical estimates with standard errors were evaluated using the bootstrap methodology. The probability distribution was inferred by calculating the means, percentiles and correlation coefficients of the base diameter and the height of the QDs. We concluded that the dot distributions were indeed a deformed Gaussian and the correlation coefficient of the diameter and the height of the QDs was 0.49 +/- 0.01. The uniformity of the dot size distribution was poor. To infer the dot size distribution from the PL spectrum, we numerically solved the Schrodinger equation by elaborating on the orthogonal periodic functions (OPF) approximation for the type II lens shaped QDs. The convergence of the probability density was discussed in a great detail. We found that the band edge discontinuities inside the dot acts as a barrier with DeltaE(v) = 315 meV for the conduction band and as a well with DeltaE(v) = 735 meV for the valence band. In the AFM measurement, the offset in dot height is 14 Angstrom and the aspect ratio is 0.04. We employed the Schrodinger equation to correlated the PL spectrum (intensity versus optical energy) to the AFM data (number of QDs versus dot size) and the agreement was excellent. (C) 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.Item type:Item, Carrier capture and relaxation of self-assembled ZnTe/ZnSe quantum dots prepared under Volmer-Weber and Stranski-Krastanow growth modes(2005-02-01) ;Lee, ME ;Yeh, YC ;Chung, YH ;Wu, CLYang, CSThe carrier capture and relaxation of type II ZnTe/ZnSe quantum dots have been investigated with ultrafast time-resolved photo luminescence upconversion. The carrier capture times were 7 and 38 ps for the Volmer-Weber mode and Stranski-Krastanow mode, respectively. We found that the carrier relaxation of QDs exhibits faster decay under the Volmer-Weber growth mode than under the Stranski-Krastanow growth mode. We attribute the difference of carrier relaxation to the wetting layer formed in the Stranski-Krastanow growth mode. (C) 2004 Elsevier B.V. All rights reserved.Item type:Item, Energy-dispersive x-ray diffraction and Raman scattering of Zn1-xMnxSe bulk crystals at high pressure(1999-06-15) ;Yang, CS ;Ro, CS ;Chou, WC ;Lin, CMChuu, DSEnergy-dispersive x-ray diffraction experiments were carried out to investigate the structure of phase transitions under high pressure. It was found that the zinc blende (B-3) to rock salt (B-1) phase transition pressures of Zn0.93Mn0.07Se and Zn0.76Mn0.24Se bulk crystals are found 11.8+/-1.5 and 9.9+/-0.5 GPa, respectively. The respective bulk moduli are 61.8+/-0.8 and 60.5+/-0.8 GPa. The pressure-induced zinc blende (ZB) to rock salt (RS) structure phase transition is interpreted as a signature of the semiconductor to metal transition for Zn1-xMnxSe. The above interpretation is further corroborated by the observation of the disappearance of the longitudinal optical phonon at the pressure where the ZB to RS structure transition occurs. (C) 1999 American Institute of Physics. [S0021-8979(99)05312-8].Item type:Item, Fabrication and physical properties of radio frequency sputtered Cd1-xMnxS thin films(1996-10-15) ;Tsai, CT ;Chen, SH ;Chuu, DS ;Chou, WC電子物理學系Highly oriented Cd1-xMnxS thin films with a wurtzite structure were grown by the radio-frequency sputtering technique. The grain size of the Cd1-xMnxS thin films was found to decrease with an increase in the Mn concentration x. Moreover, the lattice softening effect due to the quantum size effect, the band-bowing phenomena accounted for by the band-gap correction arising from the chemical disorder, and the exchange interaction between the band carrier and the d electron of the magnetic Mn ions have been investigated.Item type:Item, Fabrication and physical properties of radio frequency sputtered Cd1-xMnxS thin films(1996-10-15) ;Tsai, CT ;Chen, SH ;Chuu, DS ;Chou, WC電子物理學系Highly oriented Cd1-xMnxS thin films with a wurtzite structure were grown by the radio-frequency sputtering technique. The grain size of the Cd1-xMnxS thin films was found to decrease with an increase in the Mn concentration x. Moreover, the lattice softening effect due to the quantum size effect, the band-bowing phenomena accounted for by the band-gap correction arising from the chemical disorder, and the exchange interaction between the band carrier and the d electron of the magnetic Mn ions have been investigated.Item type:Item, Fabrication and physical properties of radio frequency sputtered ZnMnSe thin films(1997-07-01) ;Tsai, CT ;Chuu, DS ;Leou, JY ;Chou, WC電子物理學系Zn1-xMnxSe thin films with various Mn concentrations were produced by the radio frequency sputtering technique. As the Mn concentration increased, it was found that two types of crystal structures (zinc blende and wurtzite) compete with each other. The grain size of the Zn1-xMnx Se thin films decreased as Mn concentration x was increased. Moreover, the zone-center optical phonons of Zn1-xMnxSe thin films exhibit an intermediate mode behavior which is consistent with that of the bulk crystals.Item type:Item, Formation of self-assembled ZnTe quantum dots on ZnSe buffer layer grown on GaAs substrate by molecular beam epitaxy(2002-07-01) ;Kuo, MC ;Yang, CS ;Tseng, PY ;Lee, JShen, JLSelf-assembled ZnTe quantum dot structures were grown by molecular beam epitaxy on GaAs substrates with a 200 nm ZnSe buffer layer. Surface morphology was studied by atomic force microscopy. A three-dimensional Volmer-Weber growth mode was identified. Two types of dots were observed. Strong photoluminescence observed at 1.9-2.2 eV was attributed to emission from the large type II ZnTe quantum dots. Emission from the smaller ZnTe quantum dots was observed at an energy of around 2.26 eV. The density of the larger and smaller dots was approximately 10(8)/cm(2) and 10(9)/cm(2), respectively. (C) 2002 Elsevier Science B.V. All rights reserved.Item type:Item, Formation of self-organized GaN dots on Al0.11Ga0.89N by alternating supply of source precursors(2004-06-15) ;Ke, WC ;Huang, HY ;Ku, CS ;Yen, KHLee, LThe self-organized GaN dot structure is successfully grown on a slightly lattice-mismatched Al0.11Ga0.89N epilayer using flow-rate modulation epitaxy (FME) growth technique. From the variation of dot density with growth temperature, we can observe that the GaN dot growth is controlled predominately by the surface diffusion of Ga adatoms at substrate temperatures below 915degreesC and by re-evaporation at higher temperatures. Because of the special alternating gas supply feature in FME, during the Ga source step, it is the Ga metal that is deposited on the underlying Al0.11Ga0.89N layer. This is because of the large lattice mismatch of 41.8% between the Ga metal (4.51 Angstrom) and Al0.11Ga0.89N (3.18 Angstrom). We consider that the GaN dot growth in our study is mainly through the Volmer-Weber growth mode, not the commonly used Stranski-Krastanow growth mode.Item type:Item, Growth and characterization of Cd1-x-yZnxMnyTe crystals(1996-12-01) ;Chou, WC ;Chen, FR ;Chiang, TY ;Shin, HYSun, CYThe Cd1-x-yZnxMnyTe crystals, having potential in the development of magnetic field sensitive devices, were grown by the temperature gradient solution method at 940 degrees C. All crystals were p-type with resistivity of 10(7) Omega . cm. They have novel magneto-optical properties, and could be substitutes for the Cd1-xZnxTe ternary compounds in certain optoelectronic/integrated-optical device applications.Item type:Item, Growth and characterization of Cd1-x-yZnxMnyTe crystals(1996-12-01) ;Chou, WC ;Chen, FR ;Chiang, TY ;Shin, HYSun, CYThe Cd1-x-yZnxMnyTe crystals, having potential in the development of magnetic field sensitive devices, were grown by the temperature gradient solution method at 940 degrees C. All crystals were p-type with resistivity of 10(7) Omega . cm. They have novel magneto-optical properties, and could be substitutes for the Cd1-xZnxTe ternary compounds in certain optoelectronic/integrated-optical device applications.Item type:Item, Growth mode transfer of self-assembled CdSe quantum dots grown by molecular beam epitaxy(2006-01-15) ;Lai, YJ ;Lin, YC ;Fu, CP ;Yang, CSChia, CHSelf-assembled CdSe/ZnSe quantum dots (QDs) were grown at various growth temperatures on GaAs (0 0 1) by molecular beam epitaxy. An optimum growth temperature for CdSe/ZnSe QDs was found to be 260 degrees C. The Stranski-Krastanow (SK) growth mode was confirmed clearly by atomic force microscopy images. The coherent SK QDs were observed from 2.5 monolayers (MLs). Two types of QDs were found with the CdSe coverage of 3.0 MLs. It was attributed to a growth mode change from the coherent SK growth mode to the ripening growth mode. A schematic diagram of the growth mechanism of self-assembled CdSe QDs was presented. Moreover, the photoluminescence spectra of samples with various thicknesses were investigated. A dramatic change of optical properties confirmed that the QD structure formed with thickness above 2.5 MLs. Finally, the dot size and the density distributions were controlled after growth by in-chamber thermal annealing. For the sample grown at 3.0 MLs, the distribution of dot sizes was controlled from 6.0 to 6.5 x 10(3) nm(3) at an annealing temperature of 400 degrees C. (c) 2005 Published by Elsevier B.V.Item type:Item, Growth of ZnSe epilayer on Si using Ge/GexSi1-x buffer structure(2004-06-15) ;Yang, TH ;Yang, CS ;Luo, GL ;Chou, WCYang, TYThe epitaxial growth of ZnSe layers on Si substrates utilizing a Ge/Ge0.95Si0.0.5/Ge0.9Si0.1 buffer structure is demonstrated. In this study, we examine the structure, optical characteristics and atomic interdiffusion of the ZnSe epilayer grown on Si. In a sample with a 2degrees off-cut Si substrate, the outdiffusion of Ge into the ZnSe epilayer is suppressed. The low-temperature PL measurements indicate that the sample with a 2degrees off-cut Si substrate improves its optical characteristic effectively. The X-ray diffraction analysis and transmission electron microscopy (TEM) results indicate that the use of a 2degrees off-cut Ge/Ge0.95Si0.05/ Ge0.9Si0.1/Si substrate markedly improves the crystallinity of and reduced the number of threading dislocations in ZnSe grown on Si.Item type:Item, High-pressure phase transitions in Zn1-xMxSe (M=Cd, Fe, and Mn)(1998-07-01) ;Lin, CM ;Chuu, DS ;Xu, JA ;Huang, EChou, WCEnergy-dispersive x-ray diffraction was employed to study pressure-induced phase transitions in Zn0.84Fe0.16Se, Zn0.9Cd0.1Se, and Zn0.76Mn0.24Se crystals up to 21.0, 23.3, and 24.3 GPa, respectively. Our result shows that the B3 to B1 structure transitions for these crystals occurred at 1 1.4 +/- 0.5, 9.5 +/- 0.3, and 9.6 +/- 0.5 GPa, respectively. Compared to the phase-transition pressure (P-t) of ZnSe (14.4 GPa), a reduction of about 3-5 GPa is exhibited in these ternary compounds. This reduction in phase-transition pressure Delta P-t in the ternary compounds suggests that the fractional volume change, (Delta V/V-o), of the B3-B1 phase admixture might be the source of this reduction. Our results indicate that P-t (with respect to the phase transition pressure 14.4 GPa of ZnSe) is related to the fractional volume change (Delta V/V-o) by the expression P-t = [14.4003 + 0.1568 (Delta V/V-o)-0.0281(Delta V/V-o)(2)] GPa. [S0163-1829(98)05426-5].Item type:Item, Microphotoluminescence spectra of hillocks in Al0.11Ga0.89N films(2004-10-11) ;Ke, WC ;Ku, CS ;Huang, HY ;Chen, WCLee, LThe spatial variation of the optical properties of hillocks in Al0.11Ga0.89N films has been studied by using microphotoluminescence (mu-PL) microscopy. The mu-PL spectrum revealed a strong emission (I-H) at 351 nm from the hillock, besides the near-band-edge emission (I-nbe) at 341 nm. Moreover, the I-H intensity increases significantly and its full width at half maximum decreases from similar to76 to similar to53 meV by probing across the hillock center. These indicated that the hillock structure is a strong emission center. The temperature-dependent mu-PL, measurements showed that the I-H also has the S-shape behavior with a transition temperature of similar to120 K which is lower than that of I-nbe. The redshift of I-H is also smaller than I-nbe. Both indicated that the Al composition in hillocks is lower than the surrounding area. (C) 2004 American Institute of Physics.Item type:Item, Optical absorption coefficient of quantum wires in strain and electric fields with intermixing interfaces(2005-09-01) ;Lee, J ;Spector, HN ;Chou, WC ;Huang, YS電子物理學系We have theoretically studied the optical absorption coefficient of quantum wires in electric and strain fields with intermixing interfaces. The potential profiles are governed by the intermixing heterojunctions, internal strain due to the lattice mismatch, the external electric field and stress. The second Fick's law describes the wires' intermixing heterojunctions due to the alloy interdiffusion. We adopt the Green's function method to solve the Poisson equation for the displacement to determine the internal strain due to the lattice mismatch. The single-band Schrodinger equation in the effective mass approximation is used to describe the conduction subband structures while the four-band Kohn-Luttinger Hamiltonian is used to describe the valence subband structures. In solving the Schrodinger equation and the Kohn-Luttinger Hamiltonian, we expand the wave functions for the electrons and holes by using linear combinations of the two-dimensional harmonic oscillator wave functions to yield two matrix equations. These matrix equations are numerically solved for their eigen-energies and their corresponding eigenfunctions. We investigate some physical properties of the unstrained quantum wire (GaAs/AlAs) and the strained wire (CdSe/ZnSe) as examples. When the interdiffusion becomes stronger, on one hand, the internal strain is relaxed leading to the band gap shrinkage (if the initial strain epsilon(0)< 0) and, on the other hand, the potential profiles are deformed and the effective band gap becomes wider. Variations of the transition energies with external stress show the anticrossing effect and variations of the transition energies with external electric field show the field emission effect. The hole effective masses can be enhanced or become electronlike by applying stress to the wire. The oscillator strengths of the dipole-allowed intersubband transitions for the y and z polarizations are calculated to infer possible optical transitions. The optical absorption coefficients together with the joint density of states are calculated.Item type:Item, Optical characterization of ZnSe epilayers and ZnCdSe/ZnSe quantum wells grown on Ge/Ge0.95Si0.05/Ge0.9Si0.1/Si virtual substrates(2006-03-15) ;Ku, JT ;Kuo, MC ;Shen, JL ;Chiu, KCYang, THSeveral approaches have been employed to grow high-quality ZnSe epilayers on Ge/Ge0.95Si0.05/Ge0.9Si0.1/Si virtual substrates. The ZnSe epilayers were characterized by photoluminescence spectroscopy. Migration enhanced epitaxy and inserting an in situ thermal annealing ZnSe buffer layer effectively reduced the intensity of deep level emissions from the ZnSe epilayer grown on a 6 degrees-tilted Ge/Ge0.95Si0.05/Ge0.9Si0.1/Si virtual substrate. Optimized conditions for growing high-quality ZnSe were used to deposit ZnCdSe/ZnSe multiple quantum wells on Ge/Ge0.95Si0.05/Ge0.9Si0.1/Si virtual substrates. Photoluminescence spectroscopy revealed quantum-confinement effect in the ZnCdSe multiple quantum wells. The evolution of the exciton emission peak energy and the linewidth as a function of temperature indicate a low density of localized sites in the sample with a well width of 1 nm. In the high-temperature regime, the thermal quenching of the excitonic emission intensity from ZnCdSe quantum well structures was governed by the thermal activation of carriers from quantum-well-confined states into barrier states. (c) 2006 American Institute of Physics.Item type:Item, Optical properties of self-assembled ZnTe quantum dots grown by molecular-beam epitaxy(2005-02-01) ;Yang, CS ;Lai, YJ ;Chou, WC ;Chen, WKLee, MCThe morphology and the size-dependent photoluminescence (PL) spectra of the type-II ZnTe quantum dots (QDs) grown in a ZnSe matrix were obtained. The coverage of ZnTe varied from 2.5 to 3.5 monolayers (MLs). The PL peak energy decreased as the dot size increased. Excitation power and temperature-dependent PL spectra are used to characterize the optical properties of the ZnTe quantum dots. For 2.5- and 3.0-ML samples, the PL peak energy decreased monotonically as the temperature increased. However, for the 3.5-ML sample, the PL peak energy was initially blueshifted and then redshifted as the temperature increased above 40 K. Carrier thermalization and carrier transfer between QDs are used to explain the experimental data. A model of temperature-dependent linewidth broadening is employed to fit the high-temperature data. The activation energy, which was found by the simple PL intensity quenching model, of the 2.5, 3.0, and 3.5 MLs were determined to be 6.35, 9.40, and 18.87 meV, respectively. (C) 2005 American Institute of Physics.Item type:Item, Optical properties of Zn1-xCdxSe epilayers grown on (100)GaAs by molecular beam epitaxy(2004-08-01) ;Kuo, MC ;Chiu, KC ;Shih, TH ;Lai, YJYang, CSZn1-xCdxSe epilayers were grown on (100) GaAs substrates by molecular beam epitaxy. Lattice constants of the epilayers were measured by (004) rocking curve X-ray diffraction. A full width at half maximum of 475 to 2100 arcsec was obtained. The dependence of the energy gap on temperature, measured by the photoluminescence (PL) spectra, was fitted by Varshni's [Y. P. Varshni: Physica 34 149 (1967)] and O'Donnell's [R. P. O'Donnell and X. Chen: Appl. Phys. Lett. 58 2924 (1991)] models. The fitting parameters beta (161 K to 368K) and (hv) (13 meV to 24 meV), related to phonon energy, were obtained from Varshni and O'Donnell fits, respectively. The activation energies calculated from the integrated PL intensity versus inverse temperature decrease as the Cd content increases. The broadening of the PL linewidth with temperature was fitted by Gamma(T) = Gamma(0) + Gamma(a)T + Gamma(LOI)/[exp(homega(LOI)/kT) - 1] + Gamma(LO2)/[exp(homega(LO2)/kT) - 1] + Gamma(i)exp(-/kT). The impurity binding energy, (E-b), was found to decrease as the Cd composition increases.