Browsing by Author "Chu, Jinn P."
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Item type:Item, Introduction to the Special Issue on the APSPT 2013(2014-12-01) ;Wu, Jong-Shinn ;Hsu, Cheng-Che (Jerry) ;Chu, Jinn P. ;Teii, Kungen機械工程學系Item type:Item, Preface: 7th Vacuum and Surface Sciences Conference of Asia and Australia (VASSCAA-7)(2015-11-01) ;Chu, Jinn P. ;Hsiung, Gao-Yu ;Huang, Weixin ;Luo, Meng-FanChiu, Ya-PingItem type:Item, Preface: the Biennial TACT International Thin Films Conference (TACT 2015)(2016-11-01) ;Huang, Jia-Hong ;Chang, Li ;Chu, Jinn P. ;Huang, Bohr-RanHsieh, Jang-HsingItem type:Item, Titanium-based thin film metallic glass as diffusion barrier layer for PbTe-based thermoelectric modules(2019-01-01) ;Yu, Chia-Chi ;Wu, Hsin-Jay ;Agne, Matthias T. ;Witting, Ian T.Deng, Ping-YuanThe thin film metallic glass (TFMG) is an effective diffusion barrier layer for PbTe-based thermoelectric (TE) modules. Reaction couples structured with Cu/TFMG/PbTe are prepared via sputter-deposition and are annealed at 673 K for 8-96 h. The transmission line method is adopted for the assessment of electrical contact resistivity upon the PbTe/TFMG, and the value remains in the range of 3.3-2.5 x 10(-9) (Omega m(2)). The titanium-based TFMG remains amorphous upon annealing at 673 K for 48 h and effectively blocks the inter-diffusion by not having grain-boundaries, which only allows the bulk diffusion between the metal electrode and the TE substrate. (C) 2019 Author(s).