Browsing by Author "Chu, Y. Y."

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Distribution of electronic reconstruction at the n-type LaAlO(3)/SrTiO(3) interface revealed by hard x-ray photoemission spectroscopy
(2011-12-26)
Chu, Y. Y.
;
Liao, Y. F.
;
Tra, V. T.
;
Yang, J. C.
;
Liu, W. Z.
We investigated the electronic reconstruction at the n-type LaAlO(3)/SrTiO(3) interface with hard x-ray photoelectron spectroscopy (HAXPES) under grazing incidence. By exploiting the collapse of evanescent x-ray waves and the abrupt increase of x-ray absorption at the critical incidence angle, our HAXPES study reveals a 2% electronic reconstruction from Ti(4+) to Ti(3+) occurring near the interface. Such an electronic reconstruction also extends from the interface into SrTiO(3) with a depth of about 48 angstrom (similar to 12 unit cells) and an estimated total charge transfer of similar to 0.24 electrons per two-dimensional unit cell. (C) 2011 American Institute of Physics. [doi:10.1063/1.3672099]
Distribution of electronic reconstruction at the n-type LaAlO3/SrTiO3 interface revealed by hard x-ray photoemission spectroscopy
(2011-12-26)
Chu, Y. Y.
;
Liao, Y. F.
;
Tra, V. T.
;
Yang, J. C.
;
Liu, W. Z.
We investigated the electronic reconstruction at the n-type LaAlO3/SrTiO3 interface with hard x-ray photoelectron spectroscopy (HAXPES) under grazing incidence. By exploiting the collapse of evanescent x-ray waves and the abrupt increase of x-ray absorption at the critical incidence angle, our HAXPES study reveals a 2% electronic reconstruction from Ti4+ to Ti3+ occurring near the interface. Such an electronic reconstruction also extends from the interface into SrTiO3 with a depth of about 48 angstrom (similar to 12 unit cells) and an estimated total charge transfer of similar to 0.24 electrons per two-dimensional unit cell. (C) 2011 American Institute of Physics. [doi:10.1063/1.3672099]