Browsing by Author "Chuang, C. C."
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Item type:Item, A powerful test for two-sided multiple independent characteristics supplier selection problem(2015-03-04) ;Wu, C. H. ;Pearn, W. L. ;Chuang, C. C. ;工業工程與管理學系Department of Industrial Engineering and ManagementIn this article, we consider the supplier selection problem for two-sided processes with multiple independent characteristics. We review the existing division method and develop a new exact approach called the subtraction method. For practical applications, a two-phase selection procedure is established based on the subtraction method. The decision powers of two methods are compared. We show that the subtraction method we proposed is indeed more powerful than the existing division method. Several figures are presented to display the required sample sizes with various powers and various values of (C-pk1(T), C-pk2(T)). For the convenience of practitioners, the required sample sizes for the two methods with various powers and various values of (C-pk1(T), C-pk2(T))) are also tabulated.Item type:Item, An Effective Procedure for Supplier Selection Applied to Glass Substrate Processes with Multiple Lines(2014-11-01) ;Pearn, W. L. ;Wu, C. H. ;Chuang, C. C. ;工業工程與管理學系Department of Industrial Engineering and ManagementIn this paper, we consider a supplier selection problem, which compares two glass substrate processes with multiple lines and selects the one that has a higher capability. A test statistic obtained by a subtraction method is employed to establish a hypothesis test with two phases. Critical values of the test are obtained to determine the selection decisions. Sample sizes required for various designated selection powers and confidence levels are also investigated. Practitioners can use the proposed method to make reliable decisions. This paper presents a real-world case of a glass substrate process. The selection procedure uses data to reach a decision in supplier selection. We compare the results of the division method to the proposed subtraction method. The results show that the proposed subtraction method is indeed more powerful than the division method.Item type:Item, Product Acceptance Determination for Processes with Multiple Independent Lines(2014-11-01) ;Pearn, W. L. ;Wu, C. H. ;Chuang, C. C. ;工業工程與管理學系Department of Industrial Engineering and ManagementProduct acceptance determination is the problem of determining whether the manufactured product should be accepted or rejected based on the inspected sample data, under the designated risks given by the producer and the customer. The problem has received substantial research attention; the most have focused on processes with one single manufacturing line for one or multiple characteristics. In this paper, we consider the product acceptance determination problem, particularly, for processes with multiple independent manufacturing lines. Based on the designated risk, we obtain the sample size required for inspection and critical acceptance value. The results are tabulated and analyzed which is practical and useful to the engineers for their in-plant applications. Copyright (C) 2013 John Wiley & Sons, Ltd.Item type:Item, The Demonstration of Gate Dielectric -fuse 4kb OTP Memory Feasible for Embedded Applications in High -k Metal-gate CMOS Generations and Beyond(2019-01-01) ;Hsieh, E. R. ;Chang, C. W. ;Chuang, C. C. ;Chen, H. W.Chung, Steve S.A 4kb macro of One Time Programming (OTP) memory, implemented by a new breakdown, named dielectric fuse (dFuse) breakdown, has been realized on a foundry pure logic 28nm HKMG CMOS platform. The feature size of a unit cell is 1.5T per cell with 7.5F2. The experimental results show that dFuse macro exhibits high programming (PGM) speed of 100ns at 4V, read time smaller than lOns at 0.75V, and excellent data retention under one -month baking at 150 C. More importantly, the program voltage is weakly dependent on the environmental temperature, suitable for automotive applications. This OTP is also expected to be scalable to advanced node such as FinFET and provides an ideal and reliable solution for the storage purpose in loT and 5G era.