Browsing by Author "Chuang, KR"

Now showing 1 - 2 of 2

Effects of titania content and plasma treatment on the interfacial adhesion mechanism of nano titania-hybridized polyimide and copper system
(2004-06-03)
Chiang, PC
;
Whang, WT
;
Wu, SC
;
Chuang, KR
;
材料科學與工程學系
Nano-titania (TiO2) incorporated into polyimide (PI) matrix can significantly enhance the adhesion strength for PI/TiO2 hybrid film and copper system. Surface modifications by various plasma treatments (Ar, Ar/N-2 and Ar/O-2) were also applied in this study to improve the adhesion strength. The Ar/N2 plasma treatment is regarded as the more effective way in promoting the adhesion strength. The maximum adhesion value of 9.53 N/cm was obtained for the PI/TiO2-1 wt% hybrid film with Ar/N-2 plasma treatment. It is enhanced about 10 times as large as pristine PI. Furthermore, by Ar/O-2 plasma treatment, a weak boundary of copper oxide was formed at the interlayer between PI/TiO2 hybrid film and copper which decreases the adhesion strength. The effects of plasma treatment and content of nanosized TiO2 on the adhesion strength between PI/TiO2 hybrid film and copper system were studied. Atomic force microscope and contact angle analyses were used to measure the changes in surface morphology and surface energy as a result of plasma treatment. Besides, the interfacial states of peeled-off polymer side and copper side were investigated by X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM). Based on the result of XPS spectra, the peeled-off failure mode between PI/TiO2 hybrid film and copper was proposed in this study. (C) 2004 Elsevier Ltd. All rights reserved.
Significant improvement on the electroluminescence characteristics of MEH-PPV by blending with PMMA
(2000-09-01)
Chao, CS
;
Whang, WT
;
Chuang, KR
;
材料科學與工程學系
;
Department of Materials Science and Engineering
A significant improvement on the electroluminescence threshold voltage from 5.5 volts down to 2.9 volts of poly[2-methoxy-5-(2-ethylhexyloxy)-1,4-phenylene vinylene] (MEH-PPV) in the Ca/polymer/ITO diode is observed by incorporating a non-conjugated PMMA into MEH-PPV. The threshold voltage of the material decreases with the poly(methyl methacrylate) (PMMA) content. Near-field scanning absorption and photoluminescence micrographs show that the PMMA domains dispersed in the continuous MEH-PPV phase appear to be similar to sesame seeds embedded in the MEH-PPV pancakes. The resistivity of PMMA is two orders lower than that of MEH-PPV. The excellent electrical conduction of PMMA in Ca/PMMA/ITO glass devices is not due to a pin-hole defect mechanism but may result from the electron hopping from Ca through the carbonyl groups in the PMMA. The significant improvement in the threshold Voltage may be due to the combination of the electron hopping in the thin PMMA sesame seeds and the thinner thickness effect of MEH-PPV in the light emitting layer.