Browsing by Author "Chuang, Min-Hui"

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Characteristic Fluctuations of Dynamic Power Delay Induced by Random Nanosized Titanium Nitride Grains and the Aspect Ratio Effect of Gate-All-Around Nanowire CMOS Devices and Circuits
(2019-05-01)
Li, Yiming
;
Chen, Chieh-Yang
;
Chuang, Min-Hui
;
Chao, Pei-Jung
;
電機工程學系
In this study, we investigate direct current (DC)/alternating current (AC) characteristic variability induced by work function fluctuation (WKF) with respect to different nanosized metal grains and the variation of aspect ratios (ARs) of channel cross-sections on a 10 nm gate gate-all-around (GAA) nanowire (NW) metal-oxide-semiconductor field-effect transistor (MOSFET) device. The associated timing and power fluctuations of the GAA NW complementary metal-oxide-semiconductor (CMOS) circuits are further estimated and analyzed simultaneously. The experimentally validated device and circuit simulation running on a parallel computing system are intensively performed while considering the effects of WKF and various ARs to access the device's nominal and fluctuated characteristics. To provide the best accuracy of simulation, we herein calibrate the simulation results and experimental data by adjusting the fitting parameters of the mobility model. Transfer characteristics, dynamic timing, and power consumption of the tested circuit are calculated using a mixed device-circuit simulation technique. The timing fluctuation mainly follows the trend of the variation of threshold voltage. The fluctuation terms of power consumption comprising static, short-circuit, and dynamic powers are governed by the trend that the larger the grain size, the larger the fluctuation.
Numerical Simulation of Thermal Conductivity of SiNW-SiGe0.3 Composite for Thermoelectric Applications
(2020-05-01)
Lee, Ming-Yi
;
Li, Yiming
;
Chuang, Min-Hui
;
Ohori, Daisuke
;
Samukawa, Seiji
The electron band structure and phonon energy dispersion of the silicon nanowires (SiNWs) embedded in SiGe0.3 (SiNW-SiGe0.3 composite) are simulated by using the effective mass Schrodinger equation and the elastodynamic wave equation, respectively. Then, the TE properties of the SiNW-SiGe0.3 composite are investigated by the Landauer approach. The simulation shows the contribution from electrons/holes on both electrical conductance and thermal conductance increases few times by introducing SiNWs, but on the other hand, lattice thermal conductance reduces around two orders. These results are consistent with the experimental measurement and indicates that much lower lattice thermal conductance dominates the TE performance of the SiNW-SiGe0.3 composite.