Browsing by Author "Du, D. Z."

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An unexpected meeting of four seemingly unrelated problems: graph testing, DNA complex screening, superimposed codes and secure key distribution
(2007-10-01)
Chen, H. B.
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Du, D. Z.
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Hwang, F. K.
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應用數學系
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Department of Applied Mathematics
This paper discusses the relation among four problems: graph testing, DNA complex screening, superimposed codes and secure key distribution. We prove a surprising equivalence relation among these four problems, and use this equivalence to improve current results on graph testing. In the rest of this paper, we give a lower bound for the minimum number of tests on DNA complex screening model.