Browsing by Author "Han, Hao-Wei"

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Angle-resolved characteristics of silicon photovoltaics with passivated conical-frustum nanostructures
(2011-09-01)
Tseng, Ping-Chen
;
Yu, Peichen
;
Chen, Hsin-Chu
;
Tsai, Yu-Lin
;
Han, Hao-Wei
Passivation plays a critical role in silicon photovoltaics, yet how a passivation layer affects the optical characteristics of nano-patterned surfaces has rarely been discussed. In this paper, we demonstrate conical-frustum nanostructures fabricated on silicon solar cells using polystyrene colloidal lithography with various silicon-nitride (SiN(x)) passivation thicknesses. The omnidirectional and broadband antireflective characteristics were determined by utilizing angle-resolved reflectance spectroscopy. The conical-frustum arrays with a height of 550 nm and a SiN(x) thickness of 80 nm effectively suppressed the Fresnel reflection in the wavelength range from 400 to 1000 nm, up to an incidence angle of 60 degrees. As a result, the power conversion efficiency achieved was 13.39%, which showed a 9.13% enhancement compared to that of a conventional KOH-textured silicon cell. The external quantum efficiency measurements confirmed that the photocurrent was mostly contributed by the increased optical absorption in the near-infrared. The angular cell efficiencies were estimated and showed improvements over large angles of incidence. (C) 2011 Elsevier B.V. All rights reserved.
Embedded biomimetic nanostructures for enhanced optical absorption in thin-film solar cells
(2011-07-04)
Tsai, Min-An
;
Han, Hao-Wei
;
Tsai, Yu-Lin
;
Tseng, Ping-Chen
;
Yu, Peichen
Light-management is critical to thin film solar cells due to their usually limited optical absorption in the active layer. Conventional approaches involve employing separate techniques for anti-reflection and light trapping. Here, we demonstrate an embedded biomimetic nanostructure (EBN) that achieves both effects for hydrogenated amorphous silicon (a-Si: H) solar cells. The fabrication of EBNs is accomplished by patterning an index-matching silicon-nitride layer deposited on a glass substrate using polystyrene nanospheres lithography, followed by reactive ion etching. The profile of EBN is then reproduced layer by layer during the deposition of a-Si: H cells. We show that a solar cell with an optimized EBN exhibits a broadband enhanced external quantum efficiency due to both antireflection and light-trapping, with respect to an industrial standard cell using an Asahi U glass substrate which is mostly optimized for light trapping. Overall, the cell with an optimized EBN achieves a large short-circuit current density of 17.74 mA/cm(2), corresponding to a 37.63% enhancement over a flat control cell. The power conversion efficiency is also increased from 5.36% to 8.32%. Moreover, the light management enabled by the EBN remains efficient over a wide range of incident angles up to 60 degrees, which is particularly desirable for real environments with diffused sun light. The novel patterning method is not restricted to a-Si:H solar cells, but is also widely applicable to other thin film materials. (C) 2011 Optical Society of America
Enhanced efficiency for c-Si solar cell with nanopillar array via quantum dots layers
(2011-09-12)
Chen, Hsin-Chu
;
Lin, Chien-Chung
;
Han, Hao-Wei
;
Tsai, Yu-Lin
;
Chang, Chia-Hua
The enhanced efficiency of the crystalline silicon (c-Si) solar cell with nanopillar arrays (NPAs) was demonstrated by deployment of CdS quantum dots (QDs). The NPAs was fabricated by the colloidal lithography and reactive-ion etching techniques. Under a simulated one-sun condition, the device with CdS QDs shows a 33% improvement of power conversion efficiency, compared with the one without QDs. For further investigation, the excitation spectrum of photoluminescence (PL), absorbance spectrum, current-voltage (I-V) characteristics, reflectance and external quantum efficiency of the device was measured and analyzed. It is noteworthy that the enhancement of efficiency could be attributed to the photon down-conversion, the antireflection, and the improved electrical property. (C) 2011 Optical Society of America