Browsing by Author "Hernandez, Yenny"

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Graphene-Au nanoparticle based vertical heterostructures: A novel route towards high-ZT Thermoelectric devices
(2017-08-01)
Juang, Zhen-Yu
;
Tseng, Chien-Chih
;
Shi, Yumeng
;
Hsieh, Wen-Pin
;
Ryuzaki, Sou
Monolayer graphene exhibits impressive in-plane thermal conductivity (> 1000 W m(-1) K-1). However, the out-of-plane thermal transport is limited due to the weak van der Waals interaction, indicating the possibility of constructing a vertical thermoelectric (TE) device. Here, we propose a cross-plane TE device based on the vertical heterostructures of few-layer graphene and gold nanoparticles (AuNPs) on Si substrates, where the incorporation of AuNPs further inhibits the phonon transport and enhances the electrical conductivity along vertical direction. A measurable Seebeck voltage is produced vertically between top graphene and bottom Si when the device is put on a hot surface and the figure of merit ZT is estimated as 1 at room temperature from the transient Harman method. The polarity of the output voltage is determined by the carrier polarity of the substrate. The device concept is also applicable to a flexible and transparent substrate as demonstrated.
Large thermoelectric figure of merit in graphene layered devices at low temperature
(2018-01-01)
Olaya, Daniel
;
Hurtado-Morales, Mikel
;
Gomez, Daniel
;
Alejandro Castaneda-Uribe, Octavio
;
Juang, Zhen-Yu
Nanostructured materials have emerged as an alternative to enhance the figure of merit (ZT) of thermoelectric (TE) devices. Graphene exhibits a high electrical conductivity (in-plane) that is necessary for a high ZT; however, this effect is countered by its impressive thermal conductivity. In this work TE layered devices composed of electrochemically exfoliated graphene (EEG) and a phonon blocking material such as poly (3,4-ethylenedioxythiophene) polystyrene sulfonate (PEDOT:PSS), polyaniline (PANI) and gold nanoparticles (AuNPs) at the interface were prepared. The figure of merit, ZT, of each device was measured in the cross-plane direction using the Transient Harman Method (THM) and complemented with AFM-based measurements. The results show remarkable high ZT values (0.81 < ZT < 2.45) that are directly related with the topography, surface potential, capacitance gradient and resistance of the devices at the nanoscale.