Browsing by Author "Hsieh, Kun-Lin"

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Radio-over-fiber DSB-to-SSB conversion using semiconductor lasers at stable locking dynamics
(2016-05-02)
Hsieh, Kun-Lin
;
Hung, Yu-Han
;
Hwang, Sheng-Kwang
;
Lin, Chien-Chung
;
光電系統研究所
In radio-over-fiber systems, optical single-sideband (SSB) modulation signals are preferred to optical double-sideband (DSB) modulation signals for fiber distribution in order to mitigate the microwave power fading effect. However, typically adopted modulation schemes generate DSB signals, making DSB-to-SSB conversion necessary before or after fiber distribution. This study investigates a semiconductor laser at stable locking dynamics for such conversion. The conversion relies solely on the nonlinear dynamical interaction between an input DSB signal and the laser. Only a typical semiconductor laser is therefore required as the key conversion unit, and no pump or probe signal is necessary. The conversion can be achieved for a broad tunable range of microwave frequency up to at least 60 GHz. In addition, the conversion can be carried out even when the microwave frequency, the power of the input DSB signal, or the frequency of the input DSB signal fluctuates over a wide range, leading to high adaptability and stability of the conversion system. After conversion, while the microwave phase quality, such as linewidth and phase noise, is mainly preserved, a bit-error ratio down to 10(-9) is achieved for a data rate up to at least 8 Gb/s with a detection sensitivity improvement of more than 1.5 dB. (C) 2016 Optical Society of America
The application of control chart for defects and defect clustering in IC manufacturing based on fuzzy theory
(2007-04-01)
Hsieh, Kun-Lin
;
Tong, Lee-Ing
;
Wang, Min-Chia
;
工業工程與管理學系
;
Department of Industrial Engineering and Management
c-Chart was frequently used to monitor wafer defects during IC manufacturing. The clustering degree of defect on a wafer will increase along with the area of wafer gradually enlarging. The defect clustering causes the Poisson-based c-chart to exhibit many false alarms. Although several revised control charts have been developed to reduce the number of false alarms, those control charts still have some disadvantages in practical use. This study proposes a control chart that applies fuzzy theory and engineering experience to monitor wafer defects with the consideration of defect clustering. The proposed control chart is simpler and more rational than those revised c-charts. Finally, a case study of an IC company, owing to the HsinChu Scientific part at Taiwan, is used to demonstrate and verify the rationality and effectiveness. (C) 2006 Elsevier Ltd. All rights reserved.