Browsing by Author "Hsieh, RC"

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Evaluation of spatial Green's functions for microstrips: fast Hankel transform algorithm and complex image method
(1998-05-28)
Hsieh, RC
;
Kuo, JT
;
電信工程研究所
;
Institute of Communications Engineering
The fast Hankel transform (FI-IT) algorithm and complex image method (CIM) are employed to evaluate the spatial-domain Green's function for a multilayered microstrip structure. The results are compared with those obtained by exact numerical integration. It is found that both techniques have high efficiency and the FHT has better accuracy than the CIM.
Fast full-wave analysis of planar microstrip circuit elements in stratified media
(1998-09-01)
Hsieh, RC
;
Kuo, JT
;
電信工程研究所
;
Institute of Communications Engineering
The fast Hankel transform (FHT) algorithm is implemented in the mixed-potential integral-equation (MPIE) analysis of planar microstrip circuits in stratified media. The spatial-domain Green's functions are accurately and quickly obtained by applying the FHT algorithm to the exact spectral-domain counterparts, Therefore, the entire analysis procedure has high accuracy and efficiency, A nonuniform partition scheme is used to effectively model the rapid change of current distributions around discontinuities. A generalized supplementary equation accounting for arbitrary termination conditions at both feeding and load ends is also derived. The proposed method is used to design a single-stub band-stop filter and a compensated de block circuit. Experimental measurements are performed to validate the computation.
Fast full-wave characterization of arbitrary planar microstrip geometries
(1997)
Hsieh, RC
;
Kuo, JT
;
電信工程研究所
;
Institute of Communications Engineering
A very fast computation method is proposed for the mixed potential integral equation (MPIE) analysis of microstrip elements in a multilayered medium. The fast Hankel transform (FHT) algorithm is employed in this method to calculate the spatial-domain Green's function. Calculated results for some microstrip filters are compared with measurements.