Browsing by Author "Hu, CW"

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Electrical degradation of N-channel poly-Si TFT under AC stress
(2005)
Chen, CW
;
Chang, TC
;
Liu, PT
;
Lu, HY
;
Tsai, TM
The degradation of n-channel poly-silicon thin film transistor (poly-Si TFT) has been investigated under dynamic voltage stress. The ON-current of TFT is 0.03 times the initial value after 1000 s stress. However, both the sub-threshold swing and threshold voltage almost kept well during the ac stress. The current crowding effect was rapidly increased with the increasing of stress duration. The creation of effective trap density in tail-states of poly-Si film is responsible for the electrical degradation of poly-Si TFT. Moreover, the damaged regions were evidenced to be mainly near the source/drain regions according to the electrical analyses. (c) 2005 The Electrochemical Society. All rights reserved.
Fault diagnosis of odd-even sorting networks
(1997)
Hu, CW
;
Lee, CL
;
Wu, WC
;
Chen, JE
;
交大名義發表
This paper investigates detection and location for single faults in odd-even sorting networks. In the work, we have found that three tests are enough to locate single link fault and four tests are sufficient to detect single sorting element fault in an odd-even sorting network. For location tests for sorting element faults, the numbers of tests depend on the type of faults occurring at the sorting element. For most types of sorting element faults, the numbers are less than four specific tests. For the other types of faults, we have prevented the test generation procedure and binary search procedures to generate the tests. The numbers of location tests are less than (n+log(2)n), where n=log(2)N and N is the number of inputs of the sorting network.