Browsing by Author "Hu, Fang-Ling"

Now showing 1 - 2 of 2

Design on mixed-voltage I/O buffers with consideration of hot-carrier reliability
(2007)
Ker, Ming-Dou
;
Hu, Fang-Ling
;
電機學院
;
College of Electrical and Computer Engineering
A new circuit design for mixed-voltage I/O buffers to prevent hot-carrier degradation is proposed. The mixed-voltage (2xVDD tolerant) I/O buffer is designed with hot-carrier-prevented circuits in a 0.18-mu m CMOS process to receive 3.3-V (2xVDD tolerant) input signals without suffering gate-oxide reliability, circuit leakage issues, and hot-carrier degradation. In the experimental chip, the proposed mixed-voltage I/O buffer can be operated with signal speed of up to 266 MHz, which can fully meet the applications of PCI-X 2.0.
MIXED-VOLTAGE INPUT/OUTPUT BUFFER
(2008-07-03)
Ker, Ming-Dou
;
Hu, Fang-Ling
A mixed-voltage I/O buffer comprises an input circuit, an output circuit, an I/O pad, a pre-driver circuit coupled to the output circuit, two added coupled N-type transistors, and a dynamical gate-controlled circuit coupled to each gate of the two N-type transistors and the pre-driver circuit; one of the N-type transistors is coupled to the input circuit and the output circuit; the other N-type transistor and the dynamic gate-controlled circuit are together coupled to the I/O pad. Thereby, a mixed-voltage I/O buffer which receives 2×VDD-tolerant input signals and overcomes the hot-carrier degradation is realized.