Browsing by Author "Jeng, Shiang-Yao"

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Characterization of write-once blu-ray disk containing Cu-Al/Si recording layer using transmission electron microscopy
(2011-02-28)
Mai, Hung-Chuan
;
Hsieh, Tsung-Eong
;
Jeng, Shiang-Yao
;
材料科學與工程學系
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Department of Materials Science and Engineering
Microstructure change in write-once blu-ray disk containing Cu-Al/Si recording layer was investigated by transmission electron microscopy. Nanoscale crystallites were found to comprise of the Cu-Al/Si recording layer before and after signal writing and the energy dispersive spectroscopy revealed insignificant composition fluctuation in disk sample. Analytical results indicated the signal properties of disk samples are correlated with a moderate improvement of crystallinity and the formation of Cu and Si solid-solution phases due to element mixing in mark area, rather than the formation of Cu(3)Si silicide and recrystallization of recording layer as reported by previous studies. (C) 2011 American Institute of Physics. [doi:10.1063/1.3560053]
Microstructure and recording mechanism of Bi-Fe-(N) layer for high-density write-once optical disk
(2008-01-14)
Mai, Hung-Chuan
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Hsieh, Tsung-Eong
;
Jeng, Shiang-Yao
;
Chen, Chong-Ming
;
Wang, Jen-Long
Bi-Fe-(N) thin film as the recording layer of high density digital versatile disk recordable optical disk was developed. For the disk sample with optimized layer structure, maximum partial response signal to noise ratio of 21.1 and minimum simulated bit error rate of 5x10(-7) were achieved at the write power=5.7 mW. Transmission electron microscopy characterization illustrated that the separation of Bi and Fe elements to form the coarse granular structure in the mark regime during laser irradiation comprised of the recording mechanism. (c) 2008 American Institute of Physics.
Study of Al-Ti/Si bi-layer as the recording media for write-once HD-DVD optical disks
(2009-02-15)
Mai, Hung-Chuan
;
Hsieh, Tsung-Eong
;
Jeng, Shiang-Yao
;
Chen, Chong-Ming
;
Wang, Jen-Long
Optimum structure for HD-DVD optical disks containing Al-Ti/Si bi-layer recording system was identified by reflectivity simulation and dynamic test of disk samples. For the disk sample with optimized structure, the maximum partial response signal-to-noise ratio (PRSNR) of 19.1 dB, minimum simulated bit error rate (sbER) of 1.7 X 10(-7) and modulation >0.6 were achieved at the writing power (P(W)) = 11.2 mW. Transmission electron microscopy (TEM) revealed that the polycrystalline granular clusters constitute the recording marks. Subsequent analyses evidenced that element mixing/alloy reactions occur in between Si and Al-Ti layers and the formation of Al(3.21)Si(0.47) crystalline phase is responsible for the signal recording in the disk samples. (C) 2008 Elsevier B.V. All rights reserved.