Browsing by Author "Kao, C. M."

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An Extension of the Product Acceptance Determination for One-Sided Process with Multiple Characteristics
(2013-03-01)
Pearn, W. L.
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Wu, C. H.
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Hung, H. N.
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Kao, C. M.
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統計學研究所
In statistical quality control, product acceptance determination is an important problem for producer and consumer. In practical, particularly more than one quality characteristic must be simultaneously considered to improve the product quality because of the product design. In this article, we investigate the lot sentencing problem for normally distributed process with one-sided specification and multiple characteristics. We not only provide a simple procedure to help practitioners make reliable decision easily but also tabulate the required sample size and the corresponding critical acceptance value for various producer's and consumer's risks with the capability requirements AQL (acceptable quality level) and LTPD (lot tolerance percent defective). Copyright (c) 2012 John Wiley & Sons, Ltd.
Convenient Ratio Approach for Industrial Implementation in Estimating and Testing Process Yield
(2015-07-01)
Pearn, W. L.
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Tai, Y. T.
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Kao, C. M.
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統計學研究所
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工業工程與管理學系
In recent years, since portable devices with thin and light designs are essential, the applications of the thin-film transistor liquid crystal display (TFT-LCD) have been applied extensively. Process yield is the most common criterion used in the TFT-LCD manufacturing industry for measuring process performance. The measurement index Spk establishes the relationship between the manufacturing specifications and the actual process performance, which provides an exact measure on process yield. In this paper, we provide two convenient ratio approaches to calculate the lower confidence bounds and critical values extensively for various values of alpha-risk, capability requirements, and sample sizes. Practitioners can use the proposed ratio approaches and procedures to determine whether their process meets the preset capability requirement and make reliable decisions. The convenient ratio approaches can bridge the gap between the theoretical development and factory applications for evaluation of process yields.