Browsing by Author "Kuo, Jack J-Y."
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Item type:Item, Self-Heating Induced Feedback Effect on Drain Current Mismatch and Its Modeling(2011) ;Kuo, Jack J-Y. ;Su, Pin ;電子工程學系及電子研究所Department of Electronics Engineering and Institute of ElectronicsWe have reported and modeled a self-heating induced feedback effect on the drain current mismatch of nanoscale MOSFETs. The accuracy of the new model has been verified with experimental data. This effect needs to be considered when one-to-one comparisons between SOI and bulk devices regarding the variability are made.