Browsing by Author "Kuo, WK"

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On-wafer electrooptic probing using rotational deformation modulation
(2000-09-01)
Chen, WH
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Kuo, WK
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Huang, SL
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Huang, YT
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電子工程學系及電子研究所
On-wafer electrooptic probing of two-dimensional electric-field vector (E-vector) is demonstrated by using one laser beam and one electrooptic prober. This technique utilizes both compressed-stretched deformation and rotational deformation on the index ellipsoid of the electrooptic crystal. Both experiment and simulation were performed to map the E-vector on a circuit hoard, and the measurement error is within 2.2%.
Three-dimensional electric-field vector measurement with an electro-optic sensing technique
(1999-11-15)
Kuo, WK
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Huang, YT
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Huang, SL
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電子工程學系及電子研究所
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Department of Electronics Engineering and Institute of Electronics
A new technique for three-dimensional (3D) electric-field (e-field) vector measurement is presented. Three laser beams with different propagation paths in an electro-optic (EO) crystal were used to resolve 3D components of e-field vectors. We adopted a special geometric shape of bismuth silicon oxide EO crystal so that the three beams would propagate within it. A sensitivity of 0.6 V/cm root Hz was achieved. A commercial Ansoft Maxwell 3D field simulator was also used to verify our measurements. (C) 1999 Optical Society of America.
Two-dimensional electric-field vector measurement by a LiTaO3 electro-optic probe tip
(2000-09-20)
Kuo, WK
;
Chen, WH
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Huang, YT
;
Huang, SL
;
電子工程學系及電子研究所
An electro-optic probe tip that is made from LiTaO crystal to make tangentially two-dimensional electric-field (E-field) vector measurements is presented. We combine a new electro-optic modulation technique and a conventional one to resolve the two E-tield components. The new modulation effect on the optical probing beam is caused by rotation of the principal axis the electro-optic crystal, which is proportional to the E-field. Inasmuch as there is no free charge involved in the axis rotation, rotation modulation of the axis can be as fast as conventional modulation. The principles are carefully derived, and an experimental system constructed, to measure two-dimensional E-field vectors on a test pattern. The results are in good agreement with those obtained with commercial software for electromagnetic simulation. The sensitivities of two tangential E-field components are 76 (mV/cm)/root Hz and 0.8 (V/cm)root Hz, respectively. The root-mean-square error of an E-field directional measurement is 1.5 degrees. (C) 2000 Optical Society of America OCIS codes: 120.5410, 230.2090, 230.4110, 130.6010.