Browsing by Author "Lai, Cheng-Chang"
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Item type:Item, A solvent-resistant azide-based hole injection/transporting conjugated polymer for fluorescent and phosphorescent light-emitting diodes(2015-01-01) ;Huang, Cheng-Wei ;Chang, Feng-Chih ;Chu, Yu-Lin ;Lai, Cheng-ChangLin, Tzu-EnInterfacial mixing of polymers is a critical issue when attempting to improve the charge transport and stabilize the operation of solution-processed organic light-emitting diodes (OLEDs). Herein, we describe a simple methodology for overcoming interfacial mixing, based on the use of a photo-crosslinkable hole injection/transporting material (HITM). We synthesized a conjugated polymer, PTCAzide, bearing ready crosslinking ability and investigated its suitability for use as an HITM. Photo-crosslinking of the PTCAzide copolymer gave X-PTCAzide, which exhibited much higher thermal stability (the glass transition temperature increased by 21 K relative to that of PTCAzide), remarkable electrochemical stability, and excellent solvent-resistance, thereby expanding the operation time of corresponding electronic devices. Such a tris(8-hydroxy-quinolinato) aluminum-based trilayer device reached a maximum brightness of 52 971 cd m(-2), and the maximum luminance efficiency (LE) and power efficiency (eta E) are both higher than those of the corresponding device based on commercial PEDOT:PSS. In addition, a solution-processed phosphorescent OLED device incorporating X-PTCAzide also exhibited good performance (external quantum efficiency: 7.93%; LE: 29.6 cd A(-1); eta E: 14.3 lm W-1; maximum brightness: 34484 cd m(-2)). The efficient and simple photocrosslinking without adding an initiator could facilitate the fabrication process. Thus, PTCAzide appears to be a promising next-generation HITM for the development of highly efficient and inexpensive OLEDs. Its photo-crosslinkable nature allows improvements in morphological stability and hole injection/transporting ability, leading to more stable devices with better operation, without disrupting molecular packing or charge transport.Item type:Item, The influence of the interfacial layer on the stability of all-solution-processed organic light-emitting diodes(2020-08-04) ;Yang, Lan-Sheng ;Meng, Hsin-Fei ;Chao, Yu-Chiang ;Huang, Hu-ChiLuo, Chih-WeiImproving the stability of large-area organic light-emitting diodes is very important for practical applications. The interfacial layer plays a crucial role to improve the electron injection characteristic. In this work, devices prepared by various solution-processed interfacial materials and thermal-evaporated CsF were compared. In the devices with active area of 2.25 mm x 2.25 mm, we found that the performance and lifetime of the device with solution-processedLiqinterfacial layer was comparable with the device with thermal-evaporated CsF. However, for the devices with active area of 2.4 cm x 3.7 cm, the device based on thermal-evaporated CsF was the champion in both performance and lifetime. The influence of the thickness of CsF on the stability was investigated. The most stable blue fluorescent devices can be achieved when the thickness of CsF is about 0.1 nm, while the most stable green phosphorescent devices can be obtained by depositing 0.2 nm CsF. The best current efficiency for the blue fluorescent device is 4 cd A(-1), while the best one for the green phosphorescent device is 22 cd A(-1). Furthermore, burning points causing the failure of the devices were investigated by scanning electron microscopy, atomic force microscopy, thermography and secondary ion mass spectrometry. We demonstrated that burning points are defects, which can be observed after long-time operation, showing higher local temperature and fragmentary electrode.